Paper Abstract and Keywords |
Presentation |
2016-09-16 11:05
A current distribution measurement with magnetic near field intensity for designing wiring pattern in a SiC power module Eisuke Masuda, Takaaki Ibuchi, Tsuyoshi Funaki (Osaka Univ.), Hirotaka Otake, Tatsuya Miyazaki, Yasuo Kanetake, Takashi Nakamura (ROHM) EMCJ2016-50 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Fast switching operation of wide-bandgap power semiconductor devices is expected to reduce the switching losses in a power converter. However, large di/dt and dv/dt also lead to EMI(Electro-Magnetic Interference) noise by interacting with circuit parasitic component. This report studies extraction of interconnect parasitic inductance in a SiC power module using Partial Element Equivalent Circuit method, and identifies the model validation with magnetic near-field intensity measurement for PCB(Printed-Circuit Board). This report also discusses the current distribution on a PCB based on magnetic near-field intensity measurement to study the optimized wiring pattern design of SiC power module. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
SiC power module / parasitic inductance / Partial Element Equivalent Circuit method / magnetic intensity / current distribution / / / |
Reference Info. |
IEICE Tech. Rep., vol. 116, no. 223, EMCJ2016-50, pp. 1-6, Sept. 2016. |
Paper # |
EMCJ2016-50 |
Date of Issue |
2016-09-09 (EMCJ) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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EMCJ2016-50 |
Conference Information |
Committee |
EMCJ |
Conference Date |
2016-09-16 - 2016-09-16 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
University of Hyogo |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Absorber, Shield, EMC |
Paper Information |
Registration To |
EMCJ |
Conference Code |
2016-09-EMCJ |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A current distribution measurement with magnetic near field intensity for designing wiring pattern in a SiC power module |
Sub Title (in English) |
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Keyword(1) |
SiC power module |
Keyword(2) |
parasitic inductance |
Keyword(3) |
Partial Element Equivalent Circuit method |
Keyword(4) |
magnetic intensity |
Keyword(5) |
current distribution |
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1st Author's Name |
Eisuke Masuda |
1st Author's Affiliation |
Osaka University (Osaka Univ.) |
2nd Author's Name |
Takaaki Ibuchi |
2nd Author's Affiliation |
Osaka University (Osaka Univ.) |
3rd Author's Name |
Tsuyoshi Funaki |
3rd Author's Affiliation |
Osaka University (Osaka Univ.) |
4th Author's Name |
Hirotaka Otake |
4th Author's Affiliation |
ROHM Co., Ltd. (ROHM) |
5th Author's Name |
Tatsuya Miyazaki |
5th Author's Affiliation |
ROHM Co., Ltd. (ROHM) |
6th Author's Name |
Yasuo Kanetake |
6th Author's Affiliation |
ROHM Co., Ltd. (ROHM) |
7th Author's Name |
Takashi Nakamura |
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ROHM Co., Ltd. (ROHM) |
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Speaker |
Author-1 |
Date Time |
2016-09-16 11:05:00 |
Presentation Time |
25 minutes |
Registration for |
EMCJ |
Paper # |
EMCJ2016-50 |
Volume (vol) |
vol.116 |
Number (no) |
no.223 |
Page |
pp.1-6 |
#Pages |
6 |
Date of Issue |
2016-09-09 (EMCJ) |
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