Paper Abstract and Keywords |
Presentation |
2016-08-09 09:30
Yuki Otsu (KIT) IE2016-54 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
There are various methods of distance measurement. Method using image information is one of them. The advantage of image based method is that it can be handled relatively easily because there is no need for an extra special device as compared to other methods. It also obtains merits that people can determine what object exists in the image, and furthermore, the measurement can be performed after the picture was taken. The disadvantage is the little inferior of accuracy and speed when compared to other methods.
Distance measurement using the image information can be broadly classified into a stereo method and multi-view method and monocular single viewpoint method. In this study, a new distance measurement method using the symmetrical designed multi eccentric pin holes mask is proposed. Proposed method puts the mask into the imaging path of a normal single focus camera. It takes the ease of shooting like the monocular single viewpoint method, and obtains the measurement accuracy as same level as stereo method and multi-view method. |
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Reference Info. |
IEICE Tech. Rep., vol. 116, no. 176, IE2016-54, pp. 53-56, Aug. 2016. |
Paper # |
IE2016-54 |
Date of Issue |
2016-08-01 (IE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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IE2016-54 |
Conference Information |
Committee |
IE ITE-ME IPSJ-AVM ITE-CE |
Conference Date |
2016-08-08 - 2016-08-09 |
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IE |
Conference Code |
2016-08-IE-ME-AVM-CE |
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Japanese without English title) |
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Yuki Otsu |
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Kyushu Institute of Technology (KIT) |
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Date Time |
2016-08-09 09:30:00 |
Presentation Time |
30 minutes |
Registration for |
IE |
Paper # |
IE2016-54 |
Volume (vol) |
vol.116 |
Number (no) |
no.176 |
Page |
pp.53-56 |
#Pages |
4 |
Date of Issue |
2016-08-01 (IE) |
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