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| Presentation | 2016-08-03 09:45 [Invited Talk] A ReRAM-based Physically Unclonable Function with Bit Error Rate < 0.5% after 10 years at 125°C for 40nm embedded application Yuhei Yoshimoto, Yoshikazu Katoh, Satoru Ogasahara, Zhiqiang Wei, Kazuyuki Kouno (Panasonic Semiconductor Solutions Co., Ltd.)  SDM2016-61 ICD2016-29 Link to ES Tech. Rep. Archives: SDM2016-61 ICD2016-29 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | This paper presents a secure application—a physically unclonable function (PUF)—that uses the physical property of resistive random access memory (ReRAM). The proposed PUF-generating method and reproducing algorithm achieves highly reliable with bit error rate (BER) < 0.5% and reproduction exceeding 1010 times at -40 to 125˚C after 10 years at 125˚C and high uniqueness as evidenced by passing NIST tests. Evaluations on 40nm ReRAM test chips have demonstrated the feasibility of a scaled-down ReRAM cell enhanced with PUF. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | ReRAM / PUF / high reliability / security / automobile / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 116, no. 172, SDM2016-61, pp. 89-94, Aug. 2016. | |
| Paper # | SDM2016-61 | |
| Date of Issue | 2016-07-25 (SDM, ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2016-61 ICD2016-29 Link to ES Tech. Rep. Archives: SDM2016-61 ICD2016-29 |
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| Conference Information | |
| Committee | ICD SDM ITE-IST |
| Conference Date | 2016-08-01 - 2016-08-03 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Central Electric Club |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2016-08-ICD-SDM-IST |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A ReRAM-based Physically Unclonable Function with Bit Error Rate < 0.5% after 10 years at 125°C for 40nm embedded application |
| Sub Title (in English) | |
| Keyword(1) | ReRAM |
| Keyword(2) | PUF |
| Keyword(3) | high reliability |
| Keyword(4) | security |
| Keyword(5) | automobile |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yuhei Yoshimoto |
| 1st Author's Affiliation | Panasonic Semiconductor Solutions Corporation (Panasonic Semiconductor Solutions Co., Ltd.) |
| 2nd Author's Name | Yoshikazu Katoh |
| 2nd Author's Affiliation | Panasonic Semiconductor Solutions Corporation (Panasonic Semiconductor Solutions Co., Ltd.) |
| 3rd Author's Name | Satoru Ogasahara |
| 3rd Author's Affiliation | Panasonic Semiconductor Solutions Corporation (Panasonic Semiconductor Solutions Co., Ltd.) |
| 4th Author's Name | Zhiqiang Wei |
| 4th Author's Affiliation | Panasonic Semiconductor Solutions Corporation (Panasonic Semiconductor Solutions Co., Ltd.) |
| 5th Author's Name | Kazuyuki Kouno |
| 5th Author's Affiliation | Panasonic Semiconductor Solutions Corporation (Panasonic Semiconductor Solutions Co., Ltd.) |
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| Speaker | Author-1 |
| Date Time | 2016-08-03 09:45:00 |
| Presentation Time | 45 minutes |
| Registration for | SDM |
| Paper # | SDM2016-61, ICD2016-29 |
| Volume (vol) | vol.116 |
| Number (no) | no.172(SDM), no.173(ICD) |
| Page | pp.89-94 |
| #Pages | 6 |
| Date of Issue | 2016-07-25 (SDM, ICD) |
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