IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-07-15 15:20
A Durability Evaluation for Metallic-Foil Artifact-Metrics
Naoki Yoshida, Tsutomu Matsumoto (YNU) ISEC2016-37 SITE2016-31 ICSS2016-37 EMM2016-45
Abstract (in Japanese) (See Japanese page) 
(in English) We proposed that metallic foils such as aluminum foils and gold foils can be applied to artifact-metrics, because the metallic-foil surfaces have enough individuality due their manufacturing process. However metallic-foils are weak against pressures. To mitigate the weakness we have suggested to cover the foils by permeability films. In this paper, we try to evaluate the durability of a type of metallic-foil artifact-metrics by measuring the accuracy of authentication for damaged artifact-metric objects.
Keyword (in Japanese) (See Japanese page) 
(in English) Artifact-Metrics / Metallic-Foil / Laser scanning microscope / Security / Durability / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 129, ISEC2016-37, pp. 229-236, July 2016.
Paper # ISEC2016-37 
Date of Issue 2016-07-07 (ISEC, SITE, ICSS, EMM) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ISEC2016-37 SITE2016-31 ICSS2016-37 EMM2016-45

Conference Information
Committee EMM ISEC SITE ICSS IPSJ-CSEC IPSJ-SPT  
Conference Date 2016-07-14 - 2016-07-15 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) security, etc 
Paper Information
Registration To ISEC 
Conference Code 2016-07-EMM-ISEC-SITE-ICSS-CSEC-SPT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Durability Evaluation for Metallic-Foil Artifact-Metrics 
Sub Title (in English)  
Keyword(1) Artifact-Metrics  
Keyword(2) Metallic-Foil  
Keyword(3) Laser scanning microscope  
Keyword(4) Security  
Keyword(5) Durability  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Naoki Yoshida  
1st Author's Affiliation Yokohama National University (YNU)
2nd Author's Name Tsutomu Matsumoto  
2nd Author's Affiliation Yokohama National University (YNU)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2016-07-15 15:20:00 
Presentation Time 25 
Registration for ISEC 
Paper # IEICE-ISEC2016-37,IEICE-SITE2016-31,IEICE-ICSS2016-37,IEICE-EMM2016-45 
Volume (vol) IEICE-116 
Number (no) no.129(ISEC), no.130(SITE), no.131(ICSS), no.132(EMM) 
Page pp.229-236 
#Pages IEICE-8 
Date of Issue IEICE-ISEC-2016-07-07,IEICE-SITE-2016-07-07,IEICE-ICSS-2016-07-07,IEICE-EMM-2016-07-07 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan