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| Paper Abstract and Keywords | ||
| Presentation | 2016-07-15 11:10 Investigation Strategies and Relevance Metric on Dynamic Feature Location Maaki Nakano, Shinpei Hayashi, Takashi Kobayashi (Tokyo Tech.)  SS2016-17 KBSE2016-23 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In dynamic feature location based on formal concept analysis, it is a hard problem that modules implementing focused feature distribute dispersively among many formal concepts. For this reason, in locating, users must investigate many formal concepts. To improve the efficiency of this feature location technique, we propose two investigation strategies using a relevance metric. We use a similarity that is used in area of fault localization as a relevance metric. We applied our investigation strategies to several features of a representative open source software product and compared them with an existing strategy. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Dynamic Feature Location / Formal Concept Analysis / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 116, no. 127, SS2016-17, pp. 169-174, July 2016. | |
| Paper # | SS2016-17 | |
| Date of Issue | 2016-07-06 (SS, KBSE) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SS2016-17 KBSE2016-23 |
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| Conference Information | |
| Committee | KBSE SS IPSJ-SE |
| Conference Date | 2016-07-13 - 2016-07-15 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | SS |
| Conference Code | 2016-07-KBSE-SS-SE |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Investigation Strategies and Relevance Metric on Dynamic Feature Location |
| Sub Title (in English) | |
| Keyword(1) | Dynamic Feature Location |
| Keyword(2) | Formal Concept Analysis |
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| 1st Author's Name | Maaki Nakano |
| 1st Author's Affiliation | Tokyo Insitute of Technology (Tokyo Tech.) |
| 2nd Author's Name | Shinpei Hayashi |
| 2nd Author's Affiliation | Tokyo Insitute of Technology (Tokyo Tech.) |
| 3rd Author's Name | Takashi Kobayashi |
| 3rd Author's Affiliation | Tokyo Insitute of Technology (Tokyo Tech.) |
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| Speaker | Author-1 |
| Date Time | 2016-07-15 11:10:00 |
| Presentation Time | 30 minutes |
| Registration for | SS |
| Paper # | SS2016-17, KBSE2016-23 |
| Volume (vol) | vol.116 |
| Number (no) | no.127(SS), no.128(KBSE) |
| Page | pp.169-174 |
| #Pages | 6 |
| Date of Issue | 2016-07-06 (SS, KBSE) |
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