IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-07-14 09:40
Investigating the effectiveness of function clone detection tool for simultaneous fixing of defects
Seiya Numata (Osaka Univ.), Norihiro Yoshida (Nagoya Univ.), Eunjong Choi (NAIST), Katsuro Inoue (Osaka Univ.) SS2016-7 KBSE2016-13
Abstract (in Japanese) (See Japanese page) 
(in English) Code clone (i.e., code fragment that has identical or similar fragment in source code) is one of the factors that makes software maintenance more difficult. Once a developer find a defect in a code fragment, he/she has to inspect the all of the code clones of the code fragment. In this study, we investigated the effectiveness of an IR-based function clone detection tool for detecting code clones that include defects, and then confirmed high precision of the tool.
Keyword (in Japanese) (See Japanese page) 
(in English) Code clone / Software Maintenance / Function clone detection tool / Information retrieval technique / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 127, SS2016-7, pp. 77-82, July 2016.
Paper # SS2016-7 
Date of Issue 2016-07-06 (SS, KBSE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2016-7 KBSE2016-13

Conference Information
Committee KBSE SS IPSJ-SE  
Conference Date 2016-07-13 - 2016-07-15 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SS 
Conference Code 2016-07-KBSE-SS-SE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Investigating the effectiveness of function clone detection tool for simultaneous fixing of defects 
Sub Title (in English)  
Keyword(1) Code clone  
Keyword(2) Software Maintenance  
Keyword(3) Function clone detection tool  
Keyword(4) Information retrieval technique  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Seiya Numata  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Norihiro Yoshida  
2nd Author's Affiliation Nagoya University (Nagoya Univ.)
3rd Author's Name Eunjong Choi  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Katsuro Inoue  
4th Author's Affiliation Osaka University (Osaka Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2016-07-14 09:40:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2016-7, KBSE2016-13 
Volume (vol) vol.116 
Number (no) no.127(SS), no.128(KBSE) 
Page pp.77-82 
#Pages
Date of Issue 2016-07-06 (SS, KBSE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan