Paper Abstract and Keywords |
Presentation |
2016-06-17 13:55
Replacement-Opportunity Correlated Failure Models Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2016-10 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
(Not available yet) |
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Reference Info. |
IEICE Tech. Rep., vol. 116, no. 98, R2016-10, pp. 7-11, June 2016. |
Paper # |
R2016-10 |
Date of Issue |
2016-06-10 (R) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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R2016-10 |
Conference Information |
Committee |
R |
Conference Date |
2016-06-17 - 2016-06-17 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Reliability for electronics and electronic devices, Failure analysis, Overall reliability engineering |
Paper Information |
Registration To |
R |
Conference Code |
2016-06-R |
Language |
English (Japanese title is available) |
Title (in Japanese) |
(See Japanese page) |
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Title (in English) |
Replacement-Opportunity Correlated Failure Models |
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1st Author's Name |
Tadashi Dohi |
1st Author's Affiliation |
Hiroshima University (Hiroshima Univ.) |
2nd Author's Name |
Hiroyuki Okamura |
2nd Author's Affiliation |
Hiroshima University (Hiroshima Univ.) |
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Speaker |
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Date Time |
2016-06-17 13:55:00 |
Presentation Time |
25 minutes |
Registration for |
R |
Paper # |
R2016-10 |
Volume (vol) |
vol.116 |
Number (no) |
no.98 |
Page |
pp.7-11 |
#Pages |
5 |
Date of Issue |
2016-06-10 (R) |