講演抄録/キーワード |
講演名 |
2016-06-02 13:54
[ポスター講演]Near-field to Far-field Transformation using Non-contacting Near-field Measurement with Kirchhoff Surface Integral Representation in the Frequency Domain ○Sung-Mao Wu・Li-Wen Lai・Jia-Yu Liu・Bang-Cheng Chiu・Mong-Hua Tu(NUK)・Cheng-Chang Chen・Ming-Shan Lin(BSMI) EMCJ2016-31 |
抄録 |
(和) |
This paper describes a non-contacting method of achieving near-field to far-field transformation using Kirchhoff surface integral representation (KSIR).The advantages of this method include that it is possible to distinguish the six fields independently on the basis of each individual integral surface and at the same time simplify the formula calculations. A patch antenna, chosen to be the device under test, was fabricated on an FR4 with a height of 0.9mm to assist with near-field to far-field transformation and operated at a center frequency of 2.4GHz. We used a non-contacting measurement device called EM-ISIGHT, by APREL Inc., to measure the near-field radiation of the patch antenna. Combining the near-field data and the KSIR to extract the far-field radiation of the DUT was the principal transformation methodology. We verified the accuracy of the methodology by comparing the relation between electric intensity versus distance and electric intensity on the far-field surface. |
(英) |
This paper describes a non-contacting method of achieving near-field to far-field transformation using Kirchhoff surface integral representation (KSIR).The advantages of this method include that it is possible to distinguish the six fields independently on the basis of each individual integral surface and at the same time simplify the formula calculations. A patch antenna, chosen to be the device under test, was fabricated on an FR4 with a height of 0.9mm to assist with near-field to far-field transformation and operated at a center frequency of 2.4GHz. We used a non-contacting measurement device called EM-ISIGHT, by APREL Inc., to measure the near-field radiation of the patch antenna. Combining the near-field data and the KSIR to extract the far-field radiation of the DUT was the principal transformation methodology. We verified the accuracy of the methodology by comparing the relation between electric intensity versus distance and electric intensity on the far-field surface. |
キーワード |
(和) |
Near-field to far-field transformation / Kirchhoff surface integral representation / Patch antenna / Non-contacting measurement / EM-ISIGHT / / / |
(英) |
Near-field to far-field transformation / Kirchhoff surface integral representation / Patch antenna / Non-contacting measurement / EM-ISIGHT / / / |
文献情報 |
信学技報, vol. 116, no. 72, EMCJ2016-31, pp. 39-42, 2016年6月. |
資料番号 |
EMCJ2016-31 |
発行日 |
2016-05-26 (EMCJ) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
EMCJ2016-31 |