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| Presentation | 2016-05-28 15:40 On Binomial-Type Software Reliability Modeling with Test Environment Factors Shinji Inoue, Shigeru Yamada (Tottori Univ.)  R2016-7 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Considering an actual software testing phase, we have no doubt that the software reliability growth process depends on test environment factors, such as testing coverage, the number of test-runs and debugging skills, which affect the software failure occurrence or fault detection phenomenon in the testing phase. In this research, we propose a software reliability modeling approach that considers the effects of the testing environment factors based on a program size dependent discrete binomial-type software reliability model. Our model is also consistent with software reliability data collection and enables us to consider the effect of the program size. Finally, we compare the accuracy of our models in terms of mean square errors (MSE) and Akaike's information criterion (AIC) with the existing corresponding model by using actual data. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Software reliability model / Test environment / Program-size / Binomial process / Generalized linear model / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 116, no. 69, R2016-7, pp. 39-44, May 2016. | |
| Paper # | R2016-7 | |
| Date of Issue | 2016-05-21 (R) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2016-7 |
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| Conference Information | |
| Committee | R |
| Conference Date | 2016-05-28 - 2016-05-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | WINC AICHI |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Software Reliability, Overall reliability engineering |
| Paper Information | |
| Registration To | R |
| Conference Code | 2016-05-R |
| Language | English (Japanese title is available) |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Binomial-Type Software Reliability Modeling with Test Environment Factors |
| Sub Title (in English) | |
| Keyword(1) | Software reliability model |
| Keyword(2) | Test environment |
| Keyword(3) | Program-size |
| Keyword(4) | Binomial process |
| Keyword(5) | Generalized linear model |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shinji Inoue |
| 1st Author's Affiliation | Tottori University (Tottori Univ.) |
| 2nd Author's Name | Shigeru Yamada |
| 2nd Author's Affiliation | Tottori University (Tottori Univ.) |
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| Speaker | Author-1 |
| Date Time | 2016-05-28 15:40:00 |
| Presentation Time | 25 minutes |
| Registration for | R |
| Paper # | R2016-7 |
| Volume (vol) | vol.116 |
| Number (no) | no.69 |
| Page | pp.39-44 |
| #Pages | 6 |
| Date of Issue | 2016-05-21 (R) |
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