IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
... (for ESS/CS/ES/ISS)
Tech. Rep. Archives
... (for ES/CS)
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-05-19 11:05
Evaluation of scanned image tolerance by using spread spectrum digital watermarking with regression analysis
Jinjing Ma, Masaki Kawamura (Yamaguchi Univ.) IT2016-3 EMM2016-3
Abstract (in Japanese) (See Japanese page) 
(in English) In order to detect watermarks from a scanned image, we investigated color change between the stego-image and the scanned one. The color distribution of the scanned image varies depending on the distribution of the stego-image and the conditions of both printer and scanner. By this variation, it is hard to extract the watermarks from the scanned image. To improve robustness of the watermarks, we introduce the spread spectrum watermarking method in the embedder and decoder. The results of correlation between the stego-image and the scanned one by the regression method show that the mapping can be approximated by a regression line. Therefore, the color of the scanned image was corrected by using the regression line. As a result, the bit error rate for the watermarks obtained from the corrected image can be reduced.
Keyword (in Japanese) (See Japanese page) 
(in English) digital watermark / scanned image / spread spectrum / regression analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 34, EMM2016-3, pp. 13-18, May 2016.
Paper # EMM2016-3 
Date of Issue 2016-05-12 (IT, EMM) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF IT2016-3 EMM2016-3

Conference Information
Committee IT EMM  
Conference Date 2016-05-19 - 2016-05-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Otaru Economic Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Information Security, Information Theory, Information Hiding, etc. 
Paper Information
Registration To EMM 
Conference Code 2016-05-IT-EMM 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of scanned image tolerance by using spread spectrum digital watermarking with regression analysis 
Sub Title (in English)  
Keyword(1) digital watermark  
Keyword(2) scanned image  
Keyword(3) spread spectrum  
Keyword(4) regression analysis  
1st Author's Name Jinjing Ma  
1st Author's Affiliation Yamaguchi University (Yamaguchi Univ.)
2nd Author's Name Masaki Kawamura  
2nd Author's Affiliation Yamaguchi University (Yamaguchi Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2016-05-19 11:05:00 
Presentation Time 25 
Registration for EMM 
Paper # IEICE-IT2016-3,IEICE-EMM2016-3 
Volume (vol) IEICE-116 
Number (no) no.33(IT), no.34(EMM) 
Page pp.13-18 
#Pages IEICE-6 
Date of Issue IEICE-IT-2016-05-12,IEICE-EMM-2016-05-12 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan