Paper Abstract and Keywords |
Presentation |
2016-05-13 14:50
A study on influence of interconnect inductance of a SiC power module on transient characteristic Eisuke Masuda, Takaaki Ibuchi, Tsuyoshi Funaki (Osaka Univ.), Hirotaka Otake, Tatsuya Miyazaki, Yasuo Kanetake, Takashi Nakamura (ROHM) EMCJ2016-15 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Fast switching operation using wide-bandgap power semiconductor devices is expected to reduce the switching loss in a converter. However, large $di/dt$ and $dv/dt$ also lead to surge and EMI(Electro-Magnetic Interference) noise by interacting with circuit parasitic inductance. It is necessary to model parasitic component in circuit or element, and to estimate their influence on transient characteristics of power devices. This report models interconnect inductance of SiC power module using Partial Element Equivalent Circuit method and evaluates its influence on transient characteristic in a DC/DC buck converter. This work also studies the effect of a snubber capacitor on the suppression of surge voltage. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Surge / EMI / Parasitic inductance / Partial Element Equivalent Circuit method / Snubber capasitor / / / |
Reference Info. |
IEICE Tech. Rep., vol. 116, no. 26, EMCJ2016-15, pp. 35-40, May 2016. |
Paper # |
EMCJ2016-15 |
Date of Issue |
2016-05-06 (EMCJ) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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EMCJ2016-15 |
Conference Information |
Committee |
EMCJ |
Conference Date |
2016-05-13 - 2016-05-13 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hokkaido University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Power Electronics, EMC |
Paper Information |
Registration To |
EMCJ |
Conference Code |
2016-05-EMCJ |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A study on influence of interconnect inductance of a SiC power module on transient characteristic |
Sub Title (in English) |
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Keyword(1) |
Surge |
Keyword(2) |
EMI |
Keyword(3) |
Parasitic inductance |
Keyword(4) |
Partial Element Equivalent Circuit method |
Keyword(5) |
Snubber capasitor |
Keyword(6) |
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Keyword(7) |
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Keyword(8) |
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1st Author's Name |
Eisuke Masuda |
1st Author's Affiliation |
Osaka University (Osaka Univ.) |
2nd Author's Name |
Takaaki Ibuchi |
2nd Author's Affiliation |
Osaka University (Osaka Univ.) |
3rd Author's Name |
Tsuyoshi Funaki |
3rd Author's Affiliation |
Osaka University (Osaka Univ.) |
4th Author's Name |
Hirotaka Otake |
4th Author's Affiliation |
ROHM Co., Ltd. (ROHM) |
5th Author's Name |
Tatsuya Miyazaki |
5th Author's Affiliation |
ROHM Co., Ltd. (ROHM) |
6th Author's Name |
Yasuo Kanetake |
6th Author's Affiliation |
ROHM Co., Ltd. (ROHM) |
7th Author's Name |
Takashi Nakamura |
7th Author's Affiliation |
ROHM Co., Ltd. (ROHM) |
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Speaker |
Author-1 |
Date Time |
2016-05-13 14:50:00 |
Presentation Time |
25 minutes |
Registration for |
EMCJ |
Paper # |
EMCJ2016-15 |
Volume (vol) |
vol.116 |
Number (no) |
no.26 |
Page |
pp.35-40 |
#Pages |
6 |
Date of Issue |
2016-05-06 (EMCJ) |
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