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Presentation 2016-04-15 10:20
[Invited Lecture] Highly Reliable Method for Long-Term Semiconductor Data Storage
Tomonori Takahashi, Senju Yamazaki, Shuhei Tanakamaru, Tomoko Ogura Iwasaki, Shogo Hachiya, Ken Takeuchi (Chuo Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
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Conference Information
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Conference Date 2016-04-14 - 2016-04-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
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Paper Information
Registration To ICD 
Conference Code 2016-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Highly Reliable Method for Long-Term Semiconductor Data Storage 
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1st Author's Name Tomonori Takahashi  
1st Author's Affiliation Chuo University (Chuo Univ.)
2nd Author's Name Senju Yamazaki  
2nd Author's Affiliation Chuo University (Chuo Univ.)
3rd Author's Name Shuhei Tanakamaru  
3rd Author's Affiliation Chuo University (Chuo Univ.)
4th Author's Name Tomoko Ogura Iwasaki  
4th Author's Affiliation Chuo University (Chuo Univ.)
5th Author's Name Shogo Hachiya  
5th Author's Affiliation Chuo University (Chuo Univ.)
6th Author's Name Ken Takeuchi  
6th Author's Affiliation Chuo University (Chuo Univ.)
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Date Time 2016-04-15 10:20:00 
Presentation Time 25 minutes 
Registration for ICD 
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Volume (vol) vol.116 
Number (no) no.3 
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