Paper Abstract and Keywords |
Presentation |
2016-03-02 10:25
Design and Measurement Results on Vertical Transition Using Spring Contact Probes Hiroyuki Aoyama, Hidenori Ishibashi, Naofumi Yoneda, Satoshi Yamaguchi, Nayuki Yamamoto (MELCO) MW2015-174 ICD2015-97 Link to ES Tech. Rep. Archives: MW2015-174 ICD2015-97 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The fitting type connector is commonly used for RF connection between circuit substrates. However, the fitting type connector cannot be connected if the connector is shifted. Therefore, it is required to connect with a cable in order not to be affected by the mounting variation if there is a lot of place to connect. In this paper, the RF connector with spring contact probes for reducing the influence of the mounting variation is presented. The proposed RF connector is mainly consist of circuit substrates, spring contact probes and metal chassis. The coaxial line is configured by spring contact probe and metal chassis and connects two circuit substrates when pad on substrate contacts with spring contact probe. Even if circuit substrates shifted, it is possible to contact since fitting is not needed to connect. The availability of the proposed RF connector is verified by simulation and measurement. The measurement results has good agreement with simulation and shows that the insertion loss and return loss are 0.5dB and 26dB at fractional bandwidth of 100%, respectively. When the circuit substrate is shifted 0.3mm, the return loss is 23dB, which shows the availability of the proposed RF connector. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
RF connection / Spring contact probe / Transition / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 115, no. 476, MW2015-174, pp. 5-8, March 2016. |
Paper # |
MW2015-174 |
Date of Issue |
2016-02-24 (MW, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
MW2015-174 ICD2015-97 Link to ES Tech. Rep. Archives: MW2015-174 ICD2015-97 |
Conference Information |
Committee |
ICD MW |
Conference Date |
2016-03-02 - 2016-03-04 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hiroshima University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Microwave Integrated Circuit / Microwave Technologies |
Paper Information |
Registration To |
MW |
Conference Code |
2016-03-ICD-MW |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Design and Measurement Results on Vertical Transition Using Spring Contact Probes |
Sub Title (in English) |
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Keyword(1) |
RF connection |
Keyword(2) |
Spring contact probe |
Keyword(3) |
Transition |
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1st Author's Name |
Hiroyuki Aoyama |
1st Author's Affiliation |
Mitsubishi Electric Corporation (MELCO) |
2nd Author's Name |
Hidenori Ishibashi |
2nd Author's Affiliation |
Mitsubishi Electric Corporation (MELCO) |
3rd Author's Name |
Naofumi Yoneda |
3rd Author's Affiliation |
Mitsubishi Electric Corporation (MELCO) |
4th Author's Name |
Satoshi Yamaguchi |
4th Author's Affiliation |
Mitsubishi Electric Corporation (MELCO) |
5th Author's Name |
Nayuki Yamamoto |
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Mitsubishi Electric Corporation (MELCO) |
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Speaker |
Author-1 |
Date Time |
2016-03-02 10:25:00 |
Presentation Time |
25 minutes |
Registration for |
MW |
Paper # |
MW2015-174, ICD2015-97 |
Volume (vol) |
vol.115 |
Number (no) |
no.476(MW), no.477(ICD) |
Page |
pp.5-8 |
#Pages |
4 |
Date of Issue |
2016-02-24 (MW, ICD) |
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