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Paper Abstract and Keywords
Presentation 2016-03-02 10:25
Design and Measurement Results on Vertical Transition Using Spring Contact Probes
Hiroyuki Aoyama, Hidenori Ishibashi, Naofumi Yoneda, Satoshi Yamaguchi, Nayuki Yamamoto (MELCO) MW2015-174 ICD2015-97 Link to ES Tech. Rep. Archives: MW2015-174 ICD2015-97
Abstract (in Japanese) (See Japanese page) 
(in English) The fitting type connector is commonly used for RF connection between circuit substrates. However, the fitting type connector cannot be connected if the connector is shifted. Therefore, it is required to connect with a cable in order not to be affected by the mounting variation if there is a lot of place to connect. In this paper, the RF connector with spring contact probes for reducing the influence of the mounting variation is presented. The proposed RF connector is mainly consist of circuit substrates, spring contact probes and metal chassis. The coaxial line is configured by spring contact probe and metal chassis and connects two circuit substrates when pad on substrate contacts with spring contact probe. Even if circuit substrates shifted, it is possible to contact since fitting is not needed to connect. The availability of the proposed RF connector is verified by simulation and measurement. The measurement results has good agreement with simulation and shows that the insertion loss and return loss are 0.5dB and 26dB at fractional bandwidth of 100%, respectively. When the circuit substrate is shifted 0.3mm, the return loss is 23dB, which shows the availability of the proposed RF connector.
Keyword (in Japanese) (See Japanese page) 
(in English) RF connection / Spring contact probe / Transition / / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 476, MW2015-174, pp. 5-8, March 2016.
Paper # MW2015-174 
Date of Issue 2016-02-24 (MW, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MW2015-174 ICD2015-97 Link to ES Tech. Rep. Archives: MW2015-174 ICD2015-97

Conference Information
Committee ICD MW  
Conference Date 2016-03-02 - 2016-03-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Hiroshima University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Microwave Integrated Circuit / Microwave Technologies 
Paper Information
Registration To MW 
Conference Code 2016-03-ICD-MW 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Design and Measurement Results on Vertical Transition Using Spring Contact Probes 
Sub Title (in English)  
Keyword(1) RF connection  
Keyword(2) Spring contact probe  
Keyword(3) Transition  
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1st Author's Name Hiroyuki Aoyama  
1st Author's Affiliation Mitsubishi Electric Corporation (MELCO)
2nd Author's Name Hidenori Ishibashi  
2nd Author's Affiliation Mitsubishi Electric Corporation (MELCO)
3rd Author's Name Naofumi Yoneda  
3rd Author's Affiliation Mitsubishi Electric Corporation (MELCO)
4th Author's Name Satoshi Yamaguchi  
4th Author's Affiliation Mitsubishi Electric Corporation (MELCO)
5th Author's Name Nayuki Yamamoto  
5th Author's Affiliation Mitsubishi Electric Corporation (MELCO)
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Speaker Author-1 
Date Time 2016-03-02 10:25:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # MW2015-174, ICD2015-97 
Volume (vol) vol.115 
Number (no) no.476(MW), no.477(ICD) 
Page pp.5-8 
#Pages
Date of Issue 2016-02-24 (MW, ICD) 


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