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Paper Abstract and Keywords
Presentation 2016-03-01 16:15
Noise reduction effect for input dependence of Zigzag Power Gating
Tadahiro Kanamoto, Kimiyoshi Usami (Shibaura Institute of Tech.)
Abstract (in Japanese) (See Japanese page) 
(in English) In Power Gating techniques to reduce leakage current, there is the technology called Zigzag Power Gating. Zigzag Power Gating, in the nMOS Power Switch Ground Bounce noise, in the pMOS Power Switch there is a problem that Power Bounce noise is generated, respectively. It determines the output value of each gate by the input value, but this is changed by the circuit configuration. It is not clear whether an impact to the noise by the input value. In this research, along with the examine the effect of reducing noise due to the input value of Zigzag Power Gating, we propose a method to minimize the Ground Bounce (Power Bounce) by changing the input value.
Keyword (in Japanese) (See Japanese page) 
(in English) Zigzag Power Gating / Ground Bounce / Power Bounce / Genetic Algorithm / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 465, VLD2015-128, pp. 99-103, Feb. 2016.
Paper # VLD2015-128 
Date of Issue 2016-02-22 (VLD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380

Conference Information
Committee VLD  
Conference Date 2016-02-29 - 2016-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To VLD 
Conference Code 2016-02-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Noise reduction effect for input dependence of Zigzag Power Gating 
Sub Title (in English)  
Keyword(1) Zigzag Power Gating  
Keyword(2) Ground Bounce  
Keyword(3) Power Bounce  
Keyword(4) Genetic Algorithm  
1st Author's Name Tadahiro Kanamoto  
1st Author's Affiliation Shibaura Institute of Technology (Shibaura Institute of Tech.)
2nd Author's Name Kimiyoshi Usami  
2nd Author's Affiliation Shibaura Institute of Technology (Shibaura Institute of Tech.)
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Date Time 2016-03-01 16:15:00 
Presentation Time 25 
Registration for VLD 
Paper # IEICE-VLD2015-128 
Volume (vol) IEICE-115 
Number (no) no.465 
Page pp.99-103 
#Pages IEICE-5 
Date of Issue IEICE-VLD-2016-02-22 

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