IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-03-01 10:55
Power Analysis Attack for Countermeasure with Check Circuit
Yoshiya Ikezaki, Masaya Yoshikawa (Meijo Univ.) VLD2015-122
Abstract (in Japanese) (See Japanese page) 
(in English) The thread of side-channel attack against cryptgraphic circuit is pointed out. Side-channel attack is classified into two attack methods; fault analysis attack and power analysis attack. A fault analysis attack intentionally generates operation errors during the encryption processing, and obtains confidential information using pairs of an incorrect cryptogram and a correct one. A method using a check circuit was reported as a typical measure against a fault analysis attack. A power analysis attack uses the correlation between encryption processing and power consumption. However, there is no report of which a power analysis attack is applied to check circuit. Therefore, this study proposes a new power analysis method for AES with check circuit. Experiments using an actual device prove the validity of the proposed method.
Keyword (in Japanese) (See Japanese page) 
(in English) AES / Power Analysis Attack / Check Circuit / / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 465, VLD2015-122, pp. 67-72, Feb. 2016.
Paper # VLD2015-122 
Date of Issue 2016-02-22 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2015-122

Conference Information
Committee VLD  
Conference Date 2016-02-29 - 2016-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To VLD 
Conference Code 2016-02-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Power Analysis Attack for Countermeasure with Check Circuit 
Sub Title (in English)  
Keyword(1) AES  
Keyword(2) Power Analysis Attack  
Keyword(3) Check Circuit  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoshiya Ikezaki  
1st Author's Affiliation Meijo University (Meijo Univ.)
2nd Author's Name Masaya Yoshikawa  
2nd Author's Affiliation Meijo University (Meijo Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2016-03-01 10:55:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2015-122 
Volume (vol) vol.115 
Number (no) no.465 
Page pp.67-72 
#Pages
Date of Issue 2016-02-22 (VLD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan