IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-02-29 13:55
Random Testing of C Compilers Based on Test Program Generation by Equivalence Transformation
Kazuhiro Nakamura, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2015-112
Abstract (in Japanese) (See Japanese page) 
(in English) This article proposes a method of generating test programs for random testing of C compilers based on equivalence transformation on C programs. Although equivalence transformation on programs is a promising way of deriving new test programs without undefined behavior, existing test generation methods had shortcomings that they needed valid seed test programs and that they applied only addition/deletion of statements to/from unreachable portion of the seed test programs. Our method is based on program transformation on live codes, and can generate a vast variety of test programs starting from a trivial C program. Furthermore, our method can control the resulting operand values of the subexpressions in generated test programs, which contributes to a higher bug detection capability. A random test systems, Orange4, implemented based on the proposed method has detected bugs in the latest development versions of GCC-6.0.0 and LLVM/Clang-3.9. It has also detected a bug in GCC-4.5.0 which cannot be detect by our previous methods.
Keyword (in Japanese) (See Japanese page) 
(in English) compiler / reliability / random testing / equivalence transformation / minimization / Orange4 / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 465, VLD2015-112, pp. 7-12, Feb. 2016.
Paper # VLD2015-112 
Date of Issue 2016-02-22 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2015-112

Conference Information
Committee VLD  
Conference Date 2016-02-29 - 2016-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To VLD 
Conference Code 2016-02-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Random Testing of C Compilers Based on Test Program Generation by Equivalence Transformation 
Sub Title (in English)  
Keyword(1) compiler  
Keyword(2) reliability  
Keyword(3) random testing  
Keyword(4) equivalence transformation  
Keyword(5) minimization  
Keyword(6) Orange4  
Keyword(7)  
Keyword(8)  
1st Author's Name Kazuhiro Nakamura  
1st Author's Affiliation Kwansei Gakuin University (Kwansei Gakuin Univ.)
2nd Author's Name Nagisa Ishiura  
2nd Author's Affiliation Kwansei Gakuin University (Kwansei Gakuin Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2016-02-29 13:55:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2015-112 
Volume (vol) vol.115 
Number (no) no.465 
Page pp.7-12 
#Pages
Date of Issue 2016-02-22 (VLD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan