IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-01-28 11:00
[Invited Talk] Understanding of BTI for Tunnel FETs
Wataru Mizubayashi, Takahiro Mori, Koichi Fukuda, Yuki Ishikawa, Yukinori Morita, Shinji Migita, Hiroyuki Ota, Yongxun Liu, Shinichi O'uchi, Junichi Tsukada, Hiromi Yamauchi, Takashi Matsukawa, Meishoku Masahara, Kazuhiko Endo (AIST) SDM2015-122 Link to ES Tech. Rep. Archives: SDM2015-122
Abstract (in Japanese) (See Japanese page) 
(in English) (Available after conference date)
Keyword (in Japanese) (See Japanese page) 
(in English) p-type Tunnel FETs / NBTI / Activation Energy / Traps / Interface State / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 440, SDM2015-122, pp. 9-12, Jan. 2016.
Paper # SDM2015-122 
Date of Issue 2016-01-21 (SDM) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2015-122 Link to ES Tech. Rep. Archives: SDM2015-122

Conference Information
Committee SDM  
Conference Date 2016-01-28 - 2016-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SDM 
Conference Code 2016-01-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Understanding of BTI for Tunnel FETs 
Sub Title (in English)  
Keyword(1) p-type Tunnel FETs  
Keyword(2) NBTI  
Keyword(3) Activation Energy  
Keyword(4) Traps  
Keyword(5) Interface State  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Wataru Mizubayashi  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Takahiro Mori  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Koichi Fukuda  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Yuki Ishikawa  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name Yukinori Morita  
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
6th Author's Name Shinji Migita  
6th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
7th Author's Name Hiroyuki Ota  
7th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
8th Author's Name Yongxun Liu  
8th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
9th Author's Name Shinichi O'uchi  
9th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
10th Author's Name Junichi Tsukada  
10th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
11th Author's Name Hiromi Yamauchi  
11th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
12th Author's Name Takashi Matsukawa  
12th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
13th Author's Name Meishoku Masahara  
13th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
14th Author's Name Kazuhiko Endo  
14th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2016-01-28 11:00:00 
Presentation Time 30 
Registration for SDM 
Paper # IEICE-SDM2015-122 
Volume (vol) IEICE-115 
Number (no) no.440 
Page pp.9-12 
#Pages IEICE-4 
Date of Issue IEICE-SDM-2016-01-21 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan