IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-01-28 13:46
Observation of segregation of liquid crystal imaged by atomic force microscope
Yuki Kobayashi, Seiya Takahashi, Munehiro Kimura (Nagaoka Univ. of Tech.) EID2015-27 Link to ES Tech. Rep. Archives: EID2015-27
Abstract (in Japanese) (See Japanese page) 
(in English) Previously, slit coater method as an liquid crystal (LC) alignment method has been demonstrated. LC material doped with a reactive-mesogen reveals a dependence of UV intensity of irradiation on LC alignment when coating on a glass substrate. The cause of LC alignment change have not been clarified yet, however, it seems that the surface of the polymerized reactive mesogen which is segregated on a substrate by UV irradiation gives some influence on an LC alignment.
In this study, direct observation of the segregated polymer-LC interface by means of atomic force microscope (AFM) is demonstrated. It should be highlighted that, the boundary between the segregated polymer-LC can be observed without removing LC layer, as a result, much information such as the original shape of the segregation layer can be obtained. The effect of UV-polymerization on the LC alignment under some UV irradiation conditions will be discussed. The relationship between the resultant surface free energy and the pre-tilt angle will also be shown.
Keyword (in Japanese) (See Japanese page) 
(in English) atomic force microscope(AFM) / reactive-mesogen / liquid crystal / / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 439, EID2015-27, pp. 9-12, Jan. 2016.
Paper # EID2015-27 
Date of Issue 2016-01-21 (EID) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EID2015-27 Link to ES Tech. Rep. Archives: EID2015-27

Conference Information
Conference Date 2016-01-28 - 2016-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Toyama Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Joint Meeting of Emissive / Non-Emissive Displays 
Paper Information
Registration To EID 
Conference Code 2016-01-EID-IDY-EDD-JC-SSL 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Observation of segregation of liquid crystal imaged by atomic force microscope 
Sub Title (in English)  
Keyword(1) atomic force microscope(AFM)  
Keyword(2) reactive-mesogen  
Keyword(3) liquid crystal  
1st Author's Name Yuki Kobayashi  
1st Author's Affiliation Nagaoka University of Technology (Nagaoka Univ. of Tech.)
2nd Author's Name Seiya Takahashi  
2nd Author's Affiliation Nagaoka University of Technology (Nagaoka Univ. of Tech.)
3rd Author's Name Munehiro Kimura  
3rd Author's Affiliation Nagaoka University of Technology (Nagaoka Univ. of Tech.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2016-01-28 13:46:00 
Presentation Time
Registration for EID 
Paper # IEICE-EID2015-27 
Volume (vol) IEICE-115 
Number (no) no.439 
Page pp.9-12 
#Pages IEICE-4 
Date of Issue IEICE-EID-2016-01-21 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan