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Paper Abstract and Keywords
Presentation 2016-01-28 13:46
Observation of segregation of liquid crystal imaged by atomic force microscope
Yuki Kobayashi, Seiya Takahashi, Munehiro Kimura (Nagaoka Univ. of Tech.) EID2015-27 Link to ES Tech. Rep. Archives: EID2015-27
Abstract (in Japanese) (See Japanese page) 
(in English) Previously, slit coater method as an liquid crystal (LC) alignment method has been demonstrated. LC material doped with a reactive-mesogen reveals a dependence of UV intensity of irradiation on LC alignment when coating on a glass substrate. The cause of LC alignment change have not been clarified yet, however, it seems that the surface of the polymerized reactive mesogen which is segregated on a substrate by UV irradiation gives some influence on an LC alignment.
In this study, direct observation of the segregated polymer-LC interface by means of atomic force microscope (AFM) is demonstrated. It should be highlighted that, the boundary between the segregated polymer-LC can be observed without removing LC layer, as a result, much information such as the original shape of the segregation layer can be obtained. The effect of UV-polymerization on the LC alignment under some UV irradiation conditions will be discussed. The relationship between the resultant surface free energy and the pre-tilt angle will also be shown.
Keyword (in Japanese) (See Japanese page) 
(in English) atomic force microscope(AFM) / reactive-mesogen / liquid crystal / / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 439, EID2015-27, pp. 9-12, Jan. 2016.
Paper # EID2015-27 
Date of Issue 2016-01-21 (EID) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EID2015-27 Link to ES Tech. Rep. Archives: EID2015-27

Conference Information
Committee EID ITE-IDY IEE-EDD SID-JC IEIJ-SSL  
Conference Date 2016-01-28 - 2016-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Toyama Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Joint Meeting of Emissive / Non-Emissive Displays 
Paper Information
Registration To EID 
Conference Code 2016-01-EID-IDY-EDD-JC-SSL 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Observation of segregation of liquid crystal imaged by atomic force microscope 
Sub Title (in English)  
Keyword(1) atomic force microscope(AFM)  
Keyword(2) reactive-mesogen  
Keyword(3) liquid crystal  
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1st Author's Name Yuki Kobayashi  
1st Author's Affiliation Nagaoka University of Technology (Nagaoka Univ. of Tech.)
2nd Author's Name Seiya Takahashi  
2nd Author's Affiliation Nagaoka University of Technology (Nagaoka Univ. of Tech.)
3rd Author's Name Munehiro Kimura  
3rd Author's Affiliation Nagaoka University of Technology (Nagaoka Univ. of Tech.)
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Speaker
Date Time 2016-01-28 13:46:00 
Presentation Time
Registration for EID 
Paper # IEICE-EID2015-27 
Volume (vol) IEICE-115 
Number (no) no.439 
Page pp.9-12 
#Pages IEICE-4 
Date of Issue IEICE-EID-2016-01-21 


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