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| Presentation | 2015-12-18 09:25 Substrate Noise Isolation Improvement by Helium-3 Ion Irradiation Technique in a Triple-well CMOS Process Ning Li (Tokyo Tech), Takeshi Inoue (S.H.I.Examination & Inspection), Takuichi Hirano, Jian Pang, Rui Wu, Kenichi Okada (Tokyo Tech), Hitoshi Sakane (S.H.I.Examination & Inspection), Akira Matsuzawa (Tokyo Tech)  ICD2015-84 CPSY2015-97 Link to ES Tech. Rep. Archives: ICD2015-84 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | / / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 115, no. 373, ICD2015-84, pp. 75-80, Dec. 2015. | |
| Paper # | ICD2015-84 | |
| Date of Issue | 2015-12-10 (ICD, CPSY) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2015-84 CPSY2015-97 Link to ES Tech. Rep. Archives: ICD2015-84 |
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| Conference Information | |
| Committee | ICD CPSY |
| Conference Date | 2015-12-17 - 2015-12-18 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyoto Institute of Technology |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2015-12-ICD-CPSY |
| Language | English |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Substrate Noise Isolation Improvement by Helium-3 Ion Irradiation Technique in a Triple-well CMOS Process |
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| 1st Author's Name | Ning Li |
| 1st Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
| 2nd Author's Name | Takeshi Inoue |
| 2nd Author's Affiliation | S.H.I.Examination & Inspection, Ltd., (S.H.I.Examination & Inspection) |
| 3rd Author's Name | Takuichi Hirano |
| 3rd Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
| 4th Author's Name | Jian Pang |
| 4th Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
| 5th Author's Name | Rui Wu |
| 5th Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
| 6th Author's Name | Kenichi Okada |
| 6th Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
| 7th Author's Name | Hitoshi Sakane |
| 7th Author's Affiliation | S.H.I.Examination & Inspection, Ltd., (S.H.I.Examination & Inspection) |
| 8th Author's Name | Akira Matsuzawa |
| 8th Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
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| Speaker | Author-1 |
| Date Time | 2015-12-18 09:25:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | ICD2015-84, CPSY2015-97 |
| Volume (vol) | vol.115 |
| Number (no) | no.373(ICD), no.374(CPSY) |
| Page | pp.75-80 |
| #Pages | 6 |
| Date of Issue | 2015-12-10 (ICD, CPSY) |
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