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Paper Abstract and Keywords
Presentation 2015-12-18 09:00
Evaluation of Soft Error Tolerance of Redundant Flip-Flop in 65nm Bulk and FD-SOI Processes.
Eiji Sonezaki, Kubota Kanto, Masaki Masuda, Shohei Kanda, Jun Furuta, Kazutoshi Kobayashi (KIT) ICD2015-83 CPSY2015-96 Link to ES Tech. Rep. Archives: ICD2015-83
Abstract (in Japanese) (See Japanese page) 
(in English) According to process down scaling, LSI becomes less reliable for soft errors. To increase the tolerance of FFs for soft errors, several redundant FF structures are proposed such as the TMR FF. However, the
redundant FF has large area and power consumption overhead. Although it is very hard to reduce the area overhead, the power consumption overhead can be reduced to adapt low power consumption techniques. We
proposed a low power consumption redundant FFs (BCDMRACFF, DICEACFF) by combining conventional redundant FFs (BCDMRFF, DICEFF) and low power consumption techniques. We evaluated tolerance for soft error of proposed FFs in 65nm Bulk and Thin BOX FD-SOI. In Bulk, tolerance of BCDMRACFF and DICEACFF have 20 and 17 times higher than TGFF, respectively. In Thin BOX FD-SOI, number of error in proposed FFs is only one. Thin BOX FD-SOI + BCDMR or DICE have very high tolerance for soft error.
Keyword (in Japanese) (See Japanese page) 
(in English) Soft error / BCDMR / redundant FF / heavy Ion / low power consumption / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 373, ICD2015-83, pp. 69-74, Dec. 2015.
Paper # ICD2015-83 
Date of Issue 2015-12-10 (ICD, CPSY) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Conference Information
Committee ICD CPSY  
Conference Date 2015-12-17 - 2015-12-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyoto Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2015-12-ICD-CPSY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of Soft Error Tolerance of Redundant Flip-Flop in 65nm Bulk and FD-SOI Processes. 
Sub Title (in English)  
Keyword(1) Soft error  
Keyword(2) BCDMR  
Keyword(3) redundant FF  
Keyword(4) heavy Ion  
Keyword(5) low power consumption  
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Keyword(8)  
1st Author's Name Eiji Sonezaki  
1st Author's Affiliation Kyoto Institute of Technology (KIT)
2nd Author's Name Kubota Kanto  
2nd Author's Affiliation Kyoto Institute of Technology (KIT)
3rd Author's Name Masaki Masuda  
3rd Author's Affiliation Kyoto Institute of Technology (KIT)
4th Author's Name Shohei Kanda  
4th Author's Affiliation Kyoto Institute of Technology (KIT)
5th Author's Name Jun Furuta  
5th Author's Affiliation Kyoto Institute of Technology (KIT)
6th Author's Name Kazutoshi Kobayashi  
6th Author's Affiliation Kyoto Institute of Technology (KIT)
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Speaker Author-1 
Date Time 2015-12-18 09:00:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2015-83, CPSY2015-96 
Volume (vol) vol.115 
Number (no) no.373(ICD), no.374(CPSY) 
Page pp.69-74 
#Pages
Date of Issue 2015-12-10 (ICD, CPSY) 


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