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Presentation 2015-12-17 16:00
[Poster Presentation] RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (KU)   エレソ技報アーカイブはこちら
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Reference Info. IEICE Tech. Rep.
Paper #  
Date of Issue  
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Conference Information
Committee ICD CPSY  
Conference Date 2015-12-17 - 2015-12-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyoto Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2015-12-ICD-CPSY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process 
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1st Author's Name Azusa Oshima  
1st Author's Affiliation Kyoto Institute of Technology (KIT)
2nd Author's Name Pieter Weckx  
2nd Author's Affiliation IMEC (IMEC)
3rd Author's Name Ben Kaczer  
3rd Author's Affiliation IMEC (IMEC)
4th Author's Name Takashi Matsumoto  
4th Author's Affiliation University of Tokyo (UT)
5th Author's Name Kazutoshi Kobayashi  
5th Author's Affiliation Kyoto Institute of Technology (KIT)
6th Author's Name Hidetoshi Onodera  
6th Author's Affiliation Kyoto University (KU)
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Speaker
Date Time 2015-12-17 16:00:00 
Presentation Time 100 
Registration for ICD 
Paper #  
Volume (vol) IEICE-115 
Number (no) no.373(ICD), no.374(CPSY) 
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#Pages IEICE- 
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