Paper Abstract and Keywords |
Presentation |
2015-12-17 16:00
[Poster Presentation]
Performance Evaluation of Solid-State-Drives (SSDs) by Considering the effect of Error-correcting code Yusuke Yamaga, Tsukasa Tokutomi, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2015-71 CPSY2015-84 Link to ES Tech. Rep. Archives: ICD2015-71 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In the NAND flash memory based solid-state drives (SSDs), reliability is guaranteed by error correcting code (ECC). Conventional ECCs, which has higher error correction capability, causes performance degradation due to the longer ECC decoding time. Since in-place overwriting is prohibited in NAND flash, multiple read operations are required during the write in valid pages and reclaiming the free space. As a result, ECC decoding time is increased due to the frequently read operations. In this paper, the relation between performance and reliability is investigated for conventional ECCs by utilizing the SSD simulator. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
NAND flash memory / Solid-State-Drives (SSDs) / Error correction code (ECC) / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 115, no. 373, ICD2015-71, pp. 41-41, Dec. 2015. |
Paper # |
ICD2015-71 |
Date of Issue |
2015-12-10 (ICD, CPSY) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2015-71 CPSY2015-84 Link to ES Tech. Rep. Archives: ICD2015-71 |
Conference Information |
Committee |
ICD CPSY |
Conference Date |
2015-12-17 - 2015-12-18 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kyoto Institute of Technology |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2015-12-ICD-CPSY |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Performance Evaluation of Solid-State-Drives (SSDs) by Considering the effect of Error-correcting code |
Sub Title (in English) |
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Keyword(1) |
NAND flash memory |
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Solid-State-Drives (SSDs) |
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Error correction code (ECC) |
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1st Author's Name |
Yusuke Yamaga |
1st Author's Affiliation |
Chuo University (Chuo Univ.) |
2nd Author's Name |
Tsukasa Tokutomi |
2nd Author's Affiliation |
Chuo University (Chuo Univ.) |
3rd Author's Name |
Atsuro Kobayashi |
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Chuo University (Chuo Univ.) |
4th Author's Name |
Ken Takeuchi |
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Chuo University (Chuo Univ.) |
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Speaker |
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Date Time |
2015-12-17 16:00:00 |
Presentation Time |
100 minutes |
Registration for |
ICD |
Paper # |
ICD2015-71, CPSY2015-84 |
Volume (vol) |
vol.115 |
Number (no) |
no.373(ICD), no.374(CPSY) |
Page |
p.41 |
#Pages |
1 |
Date of Issue |
2015-12-10 (ICD, CPSY) |
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