Paper Abstract and Keywords |
Presentation |
2015-12-17 16:00
[Poster Presentation]
Error Pattern Analysis of Long-Term Storage with NAND Flash Memory Tomonori Takahashi, Senju Yamazaki, Ken Takeuchi (Chuo Univ.) ICD2015-77 CPSY2015-90 Link to ES Tech. Rep. Archives: ICD2015-77 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
NAND flash memory has advantages of fast access speed and high density compared with other storage devices such as hard disk drive and optical disk. It is also highly durable because it does not include mechanical reader. Therefore, it is expected as a long-term data storage device. However, in NAND flash memory, reliability trade-off exists between data-retention (DR) time and write/erase (W/E) cycle. Thus, W/E is restricted in the long-term storage applications such as archive. This paper analyzes the error pattern when we apply low W/E cycles to Triple-level cell (TLC, 3bit /cell) NAND flash memory . |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
NAND flash memory / archive / / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 115, no. 373, ICD2015-77, pp. 53-53, Dec. 2015. |
Paper # |
ICD2015-77 |
Date of Issue |
2015-12-10 (ICD, CPSY) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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ICD2015-77 CPSY2015-90 Link to ES Tech. Rep. Archives: ICD2015-77 |
Conference Information |
Committee |
ICD CPSY |
Conference Date |
2015-12-17 - 2015-12-18 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kyoto Institute of Technology |
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Paper Information |
Registration To |
ICD |
Conference Code |
2015-12-ICD-CPSY |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
Title (in English) |
Error Pattern Analysis of Long-Term Storage with NAND Flash Memory |
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NAND flash memory |
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archive |
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1st Author's Name |
Tomonori Takahashi |
1st Author's Affiliation |
Chuo University (Chuo Univ.) |
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Senju Yamazaki |
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Chuo University (Chuo Univ.) |
3rd Author's Name |
Ken Takeuchi |
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Chuo University (Chuo Univ.) |
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Speaker |
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Date Time |
2015-12-17 16:00:00 |
Presentation Time |
100 minutes |
Registration for |
ICD |
Paper # |
ICD2015-77, CPSY2015-90 |
Volume (vol) |
vol.115 |
Number (no) |
no.373(ICD), no.374(CPSY) |
Page |
p.53 |
#Pages |
1 |
Date of Issue |
2015-12-10 (ICD, CPSY) |
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