IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2015-12-14 14:30
Magnetic characteristic measurement of Cr-Si-N
Haruki Shiga, Shogo Miyamura, Kota Imanishi, Asuka Hukawa, Mutsumi Kimura, Tokiyoshi Matsuda (Ryukoku Univ.), Yashushi Hiroshima (KOA) EID2015-18 SDM2015-101 Link to ES Tech. Rep. Archives: EID2015-18 SDM2015-101
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 362, EID2015-18, pp. 39-42, Dec. 2015.
Paper # EID2015-18 
Date of Issue 2015-12-07 (EID, SDM) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EID2015-18 SDM2015-101 Link to ES Tech. Rep. Archives: EID2015-18 SDM2015-101

Conference Information
Committee EID SDM  
Conference Date 2015-12-14 - 2015-12-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Ryukoku University, Avanti Kyoto Hall 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Si and Si-related Materials and Devices, and Display Technology 
Paper Information
Registration To EID 
Conference Code 2015-12-EID-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Magnetic characteristic measurement of Cr-Si-N 
Sub Title (in English)  
1st Author's Name Haruki Shiga  
1st Author's Affiliation Ryukoku University (Ryukoku Univ.)
2nd Author's Name Shogo Miyamura  
2nd Author's Affiliation Ryukoku University (Ryukoku Univ.)
3rd Author's Name Kota Imanishi  
3rd Author's Affiliation Ryukoku University (Ryukoku Univ.)
4th Author's Name Asuka Hukawa  
4th Author's Affiliation Ryukoku University (Ryukoku Univ.)
5th Author's Name Mutsumi Kimura  
5th Author's Affiliation Ryukoku University (Ryukoku Univ.)
6th Author's Name Tokiyoshi Matsuda  
6th Author's Affiliation Ryukoku University (Ryukoku Univ.)
7th Author's Name Yashushi Hiroshima  
7th Author's Affiliation KOA (KOA)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2015-12-14 14:30:00 
Presentation Time 15 
Registration for EID 
Paper # IEICE-EID2015-18,IEICE-SDM2015-101 
Volume (vol) IEICE-115 
Number (no) no.362(EID), no.363(SDM) 
Page pp.39-42 
#Pages IEICE-4 
Date of Issue IEICE-EID-2015-12-07,IEICE-SDM-2015-12-07 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan