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| Presentation | 2015-12-02 14:35 Study on a tolerance for process variability in Single Slope ADC using interpolative TDC Kaihei Hotta, Kenichi Ohhata (Kagishima Univ.)  CPM2015-131 ICD2015-56 Link to ES Tech. Rep. Archives: CPM2015-131 ICD2015-56 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We proposed a novel single slope ADC using an interpolative TDC (ITDC) to develop a high-speed and low-power ADC, and reported that the proposed ADC demonstrated a high sampling frequency of 500 MHz. It is predicted that the accuracy of the ITDC is seriously degraded due to the process variability because its resolution is a half of that of the conventional TDC. Therefore, the influence of the process variability on the accuracy of the ITDC was investigated. As a result, we found that the influence of the comparator offset was negligible, and the conversion gain of the ADC considerably changed due to the delay time change of the ring oscillator, and the conversion error increased due to the timing mismatch in the sampling switch. Moreover, it was shown that the conversion error generated by above-mentioned phenomena could be compensated for by adjustment of the ramp speed and threshold voltage of the comparator. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Single slope ADC / process variability / Interpolative TDC / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 115, no. 341, ICD2015-56, pp. 23-27, Dec. 2015. | |
| Paper # | ICD2015-56 | |
| Date of Issue | 2015-11-24 (CPM, ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | CPM2015-131 ICD2015-56 Link to ES Tech. Rep. Archives: CPM2015-131 ICD2015-56 |
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| Conference Information | |
| Committee | VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
| Conference Date | 2015-12-01 - 2015-12-03 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Nagasaki Kinro Fukushi Kaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2015 -New Field of VLSI Design- |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2015-12-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on a tolerance for process variability in Single Slope ADC using interpolative TDC |
| Sub Title (in English) | |
| Keyword(1) | Single slope ADC |
| Keyword(2) | process variability |
| Keyword(3) | Interpolative TDC |
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| 1st Author's Name | Kaihei Hotta |
| 1st Author's Affiliation | Kagoshima University (Kagishima Univ.) |
| 2nd Author's Name | Kenichi Ohhata |
| 2nd Author's Affiliation | Kagoshima University (Kagishima Univ.) |
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| Speaker | Author-1 |
| Date Time | 2015-12-02 14:35:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | CPM2015-131, ICD2015-56 |
| Volume (vol) | vol.115 |
| Number (no) | no.340(CPM), no.341(ICD) |
| Page | pp.23-27 |
| #Pages | 5 |
| Date of Issue | 2015-11-24 (CPM, ICD) |
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