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| Presentation | 2015-09-17 10:55 New Expression of Loss in LC Circuts Kyohei Yamada, Naoki Sakai, Takashi Ohira (TUT)  MW2015-88 Link to ES Tech. Rep. Archives: MW2015-88 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Two kinds of geometric expressions of losses in a matching circuit are presented using a concept of length or distance. The first one, employing "Manhattan distance," describes a loss in an L-shaped matching circuit and a lucid way to reduce the loss. The second one, based on hyperbolic geometry, is for not only L-shaped circuit but also any combination of shunt/series capacitors/inductors. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | matching circuit / lumped-constant element / energy loss / quality factor / Manhattan distance / Poincare metric / / | |
| Reference Info. | IEICE Tech. Rep., vol. 115, no. 227, MW2015-88, pp. 9-12, Sept. 2015. | |
| Paper # | MW2015-88 | |
| Date of Issue | 2015-09-10 (MW) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MW2015-88 Link to ES Tech. Rep. Archives: MW2015-88 |
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| Conference Information | |
| Committee | MW AP |
| Conference Date | 2015-09-17 - 2015-09-18 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Oyama National College of Tech. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave and Millimeter-wave |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2015-09-MW-AP |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | New Expression of Loss in LC Circuts |
| Sub Title (in English) | |
| Keyword(1) | matching circuit |
| Keyword(2) | lumped-constant element |
| Keyword(3) | energy loss |
| Keyword(4) | quality factor |
| Keyword(5) | Manhattan distance |
| Keyword(6) | Poincare metric |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Kyohei Yamada |
| 1st Author's Affiliation | Toyohashi University of Technology (TUT) |
| 2nd Author's Name | Naoki Sakai |
| 2nd Author's Affiliation | Toyohashi University of Technology (TUT) |
| 3rd Author's Name | Takashi Ohira |
| 3rd Author's Affiliation | Toyohashi University of Technology (TUT) |
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| Speaker | Author-1 |
| Date Time | 2015-09-17 10:55:00 |
| Presentation Time | 25 minutes |
| Registration for | MW |
| Paper # | MW2015-88 |
| Volume (vol) | vol.115 |
| Number (no) | no.227 |
| Page | pp.9-12 |
| #Pages | 4 |
| Date of Issue | 2015-09-10 (MW) |
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