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Paper Abstract and Keywords
Presentation 2015-06-26 15:20
Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance
Tohlu Matsushima, Nobuaki Ikehara, Hidetoshi Miyahara, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-30
Abstract (in Japanese) (See Japanese page) 
(in English) In this report, an ICIM-CI model, which is discussed in IEC, for evaluation of IC immunity is described. In addition, a construction method of the ICIM-CI model is presented. A commercial LDO regulator and 2-layer printed circuit boards are used for evaluation of the proposed method. The ICIM-CI model consists of a PDN block and an IB block. The PDN block represents transmission and reflection characteristics of RF disturbance injected to an input pin of the LDO regulator. S parameter measurement and S to Z conversion give characteristics of the PDN block. The IB block is a database describing relation between an output voltage fluctuation and injunction power and the induced voltage or current of the IC pin. For construction of the IB block, the DPI measurement is used. Calculation of the voltage induced by the conducted disturbance using PDN block and comparison between this induced voltage and the IB data are able to estimate immunity characteristics of the LDO regulator. The immunity simulations agree very well with the measurement results of the LDO regulator mounted on the test PCBs which have a different bypass capacitor from the test board using for ICIM-CI model extraction.
Keyword (in Japanese) (See Japanese page) 
(in English) ICIM-CI / Immunity / DPI method / Conducted disturbance / LDO regulator / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 114, EMCJ2015-30, pp. 73-78, June 2015.
Paper # EMCJ2015-30 
Date of Issue 2015-06-18 (EMCJ) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ IEE-EMC IEE-MAG  
Conference Date 2015-06-25 - 2015-06-26 
Place (in Japanese) (See Japanese page) 
Place (in English) KMITL, Thailand 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC Joint Workshop, 2015, Bangkok 
Paper Information
Registration To EMCJ 
Conference Code 2015-06-EMCJ-EMC-MAG 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance 
Sub Title (in English)  
Keyword(1) ICIM-CI  
Keyword(2) Immunity  
Keyword(3) DPI method  
Keyword(4) Conducted disturbance  
Keyword(5) LDO regulator  
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1st Author's Name Tohlu Matsushima  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Nobuaki Ikehara  
2nd Author's Affiliation Kyoto University (Kyoto Univ.)
3rd Author's Name Hidetoshi Miyahara  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
4th Author's Name Takashi Hisakado  
4th Author's Affiliation Kyoto University (Kyoto Univ.)
5th Author's Name Osami Wada  
5th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker
Date Time 2015-06-26 15:20:00 
Presentation Time 25 
Registration for EMCJ 
Paper # IEICE-EMCJ2015-30 
Volume (vol) IEICE-115 
Number (no) no.114 
Page pp.73-78 
#Pages IEICE-6 
Date of Issue IEICE-EMCJ-2015-06-18 


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