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Paper Abstract and Keywords
Presentation 2015-05-28 15:15
Control of N composition of GaAsN alloy grown by surface nitridation
Noriyuki Urakami, Keisuke Yamane, Hiroto Sekiguchi, Hiroshi Okada, Akihiro Wakahara (Toyohashi Tech.) ED2015-20 CPM2015-5 SDM2015-22 Link to ES Tech. Rep. Archives: ED2015-20 CPM2015-5 SDM2015-22
Abstract (in Japanese) (See Japanese page) 
(in English) We researched growth conditions effect for N composition and luminescence property on dilute nitride GaAsN alloy grown by repeating surface nitridation and GaAs regrowth of few monolayer. Nitridation surface of GaAs (001) above 540 °C indicated the change process to N-stabilized surface by the increase of nitridation time because observation the RHEED patterns changed from (2×4) to (1×4) or (3×4). In cases of temperature below 540 °C, c(4×4)pattern of GaAs surface was same before and after nitridation. N composition of the GaAsN alloys strongly depended of the growth temperature, i.e.;, N composition saturated with 2.2% at 600 °C, but N composition at 550 °C increased by the increase of nitridation time. N composition was controlled between 1 to 5% by the variation of the growth temperature and thickness of GaAs overlayer. While the increase of interruption time after nitridation occurred the decrease of N composition, it had no practical impact on the luminescence properties. The thickness of GaAs overlayer was investigated to increase layer thickness of GaAsN alloy. The thickness of GaAs overlayer was necessary above 4 ML because of treatment of flatness of GaAs overlayer. The integrated RT-PL intensity of surface nitridation was increased 8 times higher than that of a conventional growth method.
Keyword (in Japanese) (See Japanese page) 
(in English) Surface Nitridation / δ doping / Dilute nitride / III-V-N alloy / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 63, ED2015-20, pp. 21-26, May 2015.
Paper # ED2015-20 
Date of Issue 2015-05-21 (ED, CPM, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2015-20 CPM2015-5 SDM2015-22 Link to ES Tech. Rep. Archives: ED2015-20 CPM2015-5 SDM2015-22

Conference Information
Committee ED CPM SDM  
Conference Date 2015-05-28 - 2015-05-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Venture Business Laboratory, Toyohashi University of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) crystal growth、devices characterization , etc. 
Paper Information
Registration To ED 
Conference Code 2015-05-ED-CPM-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Control of N composition of GaAsN alloy grown by surface nitridation 
Sub Title (in English)  
Keyword(1) Surface Nitridation  
Keyword(2) δ doping  
Keyword(3) Dilute nitride  
Keyword(4) III-V-N alloy  
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1st Author's Name Noriyuki Urakami  
1st Author's Affiliation Toyohashi University of Technology (Toyohashi Tech.)
2nd Author's Name Keisuke Yamane  
2nd Author's Affiliation Toyohashi University of Technology (Toyohashi Tech.)
3rd Author's Name Hiroto Sekiguchi  
3rd Author's Affiliation Toyohashi University of Technology (Toyohashi Tech.)
4th Author's Name Hiroshi Okada  
4th Author's Affiliation Toyohashi University of Technology (Toyohashi Tech.)
5th Author's Name Akihiro Wakahara  
5th Author's Affiliation Toyohashi University of Technology (Toyohashi Tech.)
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Speaker Author-1 
Date Time 2015-05-28 15:15:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2015-20, CPM2015-5, SDM2015-22 
Volume (vol) vol.115 
Number (no) no.63(ED), no.64(CPM), no.65(SDM) 
Page pp.21-26 
#Pages
Date of Issue 2015-05-21 (ED, CPM, SDM) 


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