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Paper Abstract and Keywords
Presentation 2015-05-28 15:20
Rapid Recovery Technique from Soft Error of FPGAs in Information and Communication Apparatus
Kenichi Shimbo, Tadanobu Toba, Takumi Uezono, Hidefumi Ibe (Hitachi) RCC2015-9 MICT2015-9
Abstract (in Japanese) (See Japanese page) 
(in English) As the amount of data traffic through the communication infrastructure is increasing, a development of high-speed information and communication apparatus enabling to handle large volumes of data is required. An information and communication apparatus has a lot of programmable devices such as FPGAs because of their design flexibility. On the other hand, use of high-speed and well-integrated FPGA faces a growing risk of malfunction caused by terrestrial-neutron induced soft errors. In a conventional method for mitigating soft errors, configuration memories (CRAM) which is the weakest circuit in FPGAs is scanned and corrected by circuit IP provided by FPGA vendors. However, multi-die FPGAs have large volume of CRAMs resulting long time to recover soft errors. In fact, it is difficult to guarantee a continuity of services while recovering system operation. This time, we developed a novel circuit IP, called CRAM-control engine, which recovers soft errors in short time by controlling CRAM areas to be scanned and scan-sequence. In this report, we introduce an overview of our developed IP and its features, and report confirmation results of the efficiency of our IP by neutron-irradiation tests.
Keyword (in Japanese) (See Japanese page) 
(in English) Neutron / Soft-error / FPGA / CRAM / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 58, RCC2015-9, pp. 37-42, May 2015.
Paper # RCC2015-9 
Date of Issue 2015-05-21 (RCC, MICT) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF RCC2015-9 MICT2015-9

Conference Information
Committee RCC MICT  
Conference Date 2015-05-28 - 2015-05-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliable Communication and Control, Healthcare and Medical Information Communication Technologies, etc. 
Paper Information
Registration To RCC 
Conference Code 2015-05-RCC-MICT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Rapid Recovery Technique from Soft Error of FPGAs in Information and Communication Apparatus 
Sub Title (in English)  
Keyword(1) Neutron  
Keyword(2) Soft-error  
Keyword(3) FPGA  
Keyword(4) CRAM  
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1st Author's Name Kenichi Shimbo  
1st Author's Affiliation Hitachi,Ltd (Hitachi)
2nd Author's Name Tadanobu Toba  
2nd Author's Affiliation Hitachi,Ltd (Hitachi)
3rd Author's Name Takumi Uezono  
3rd Author's Affiliation Hitachi,Ltd (Hitachi)
4th Author's Name Hidefumi Ibe  
4th Author's Affiliation Hitachi,Ltd (Hitachi)
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Speaker Author-1 
Date Time 2015-05-28 15:20:00 
Presentation Time 25 minutes 
Registration for RCC 
Paper # RCC2015-9, MICT2015-9 
Volume (vol) vol.115 
Number (no) no.58(RCC), no.59(MICT) 
Page pp.37-42 
#Pages
Date of Issue 2015-05-21 (RCC, MICT) 


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