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Paper Abstract and Keywords
Presentation 2015-04-16 13:50
[Invited Lecture] 40 nm Dual-port and Two-port SRAMs for Automotive MCU Applications under the Wide Temperature Range of -40 to 170℃ with Test Screening Against Write Disturb Issues
Yoshisato Yokoyama, Yuichiro Ishii, Tatsuya Fukuda, Yoshiki Tsujihashi, Atsushi Miyanishi (Renesas Electronics), Shinobu Asayama, Keiichi Maekawa, Kazutoshi Shiba (Renesas Semiconductor Manufacturing Corporation), Koji Nii (Renesas Electronics) ICD2015-3 Link to ES Tech. Rep. Archives: ICD2015-3
Abstract (in Japanese) (See Japanese page) 
(in English) (Available after conference date)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 6, ICD2015-3, pp. 9-14, April 2015.
Paper # ICD2015-3 
Date of Issue 2015-04-09 (ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2015-3 Link to ES Tech. Rep. Archives: ICD2015-3

Conference Information
Committee ICD  
Conference Date 2015-04-16 - 2015-04-17 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2015-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) 40 nm Dual-port and Two-port SRAMs for Automotive MCU Applications under the Wide Temperature Range of -40 to 170℃ with Test Screening Against Write Disturb Issues 
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1st Author's Name Yoshisato Yokoyama  
1st Author's Affiliation Renesas Electronics (Renesas Electronics)
2nd Author's Name Yuichiro Ishii  
2nd Author's Affiliation Renesas Electronics (Renesas Electronics)
3rd Author's Name Tatsuya Fukuda  
3rd Author's Affiliation Renesas Electronics (Renesas Electronics)
4th Author's Name Yoshiki Tsujihashi  
4th Author's Affiliation Renesas Electronics (Renesas Electronics)
5th Author's Name Atsushi Miyanishi  
5th Author's Affiliation Renesas Electronics (Renesas Electronics)
6th Author's Name Shinobu Asayama  
6th Author's Affiliation Renesas Semiconductor Manufacturing Corporation (Renesas Semiconductor Manufacturing Corporation)
7th Author's Name Keiichi Maekawa  
7th Author's Affiliation Renesas Semiconductor Manufacturing Corporation (Renesas Semiconductor Manufacturing Corporation)
8th Author's Name Kazutoshi Shiba  
8th Author's Affiliation Renesas Semiconductor Manufacturing Corporation (Renesas Semiconductor Manufacturing Corporation)
9th Author's Name Koji Nii  
9th Author's Affiliation Renesas Electronics (Renesas Electronics)
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Speaker
Date Time 2015-04-16 13:50:00 
Presentation Time 25 
Registration for ICD 
Paper # IEICE-ICD2015-3 
Volume (vol) IEICE-115 
Number (no) no.6 
Page pp.9-14 
#Pages IEICE-6 
Date of Issue IEICE-ICD-2015-04-09 


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