IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2015-01-29 18:00
CF3: Test suite for arithmetic optimization of C compilers
Yusuke Hibino, Nagisa Ishiura (KGU) VLD2014-130 CPSY2014-139 RECONF2014-63
Abstract (in Japanese) (See Japanese page) 
(in English) This article presents a compiler test suite "CF3," which targets arithmetic optimization, especially constant folding, of C compilers. While Orange3 is a random test system which has detected bugs in the latest versions of GCC and LLVM/Clang, it may generate, for some compilers, many long error programs which detect the same bugs repeatedly. A new test suite CF3 is based on an observation that most of the error programs for GCCs have been reduced to small programs each consisting of a single expression with 3 operations. CF3 consists of 10,985 fi les, which cover all the possible expression patterns build up with 3 operations, and each file contains 100 cases to test optimization for the expression pattern with different types and initial values of 4 variables. Experiments on GCC and LLVM/Clang show that CF3 detects more error program patterns than Orange3 within the same computation
time.
Keyword (in Japanese) (See Japanese page) 
(in English) Compiler / Test suite / Randomtest / / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 426, VLD2014-130, pp. 117-122, Jan. 2015.
Paper # VLD2014-130 
Date of Issue 2015-01-22 (VLD, CPSY, RECONF) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2014-130 CPSY2014-139 RECONF2014-63

Conference Information
Committee RECONF CPSY VLD IPSJ-SLDM  
Conference Date 2015-01-29 - 2015-01-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Hiyoshi Campus, Keio University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) FPGA Applications, etc 
Paper Information
Registration To VLD 
Conference Code 2015-01-RECONF-CPSY-VLD-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) CF3: Test suite for arithmetic optimization of C compilers 
Sub Title (in English)  
Keyword(1) Compiler  
Keyword(2) Test suite  
Keyword(3) Randomtest  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yusuke Hibino  
1st Author's Affiliation Kwansei Gakuin University (KGU)
2nd Author's Name Nagisa Ishiura  
2nd Author's Affiliation Kwansei Gakuin University (KGU)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2015-01-29 18:00:00 
Presentation Time 20 
Registration for VLD 
Paper # IEICE-VLD2014-130,IEICE-CPSY2014-139,IEICE-RECONF2014-63 
Volume (vol) IEICE-114 
Number (no) no.426(VLD), no.427(CPSY), no.428(RECONF) 
Page pp.117-122 
#Pages IEICE-6 
Date of Issue IEICE-VLD-2015-01-22,IEICE-CPSY-2015-01-22,IEICE-RECONF-2015-01-22 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan