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| Presentation | 2015-01-27 16:20 [Invited Talk] Scaling Breakthrough for Analog/Digital Circuits by Suppressing Variability and Low-Frequency Noise for FinFETs by Amorphous Metal Gate Technology Takashi Matsukawa, Koichi Fukuda, Yongxun Liu, Junichi Tsukada, Hiromi Yamauchi, Yuki Ishikawa, Kazuhiko Endo, Shinichi O'uchi, Shinji Migita, Wataru Mizubayashi, Yukinori Morita, Hiroyuki Ota, Meishoku Masahara (AIST)  SDM2014-145 Link to ES Tech. Rep. Archives: SDM2014-145 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | / / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 114, no. 421, SDM2014-145, pp. 41-44, Jan. 2015. | |
| Paper # | SDM2014-145 | |
| Date of Issue | 2015-01-20 (SDM) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2014-145 Link to ES Tech. Rep. Archives: SDM2014-145 |
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| Conference Information | |
| Committee | SDM |
| Conference Date | 2015-01-27 - 2015-01-27 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2015-01-SDM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Scaling Breakthrough for Analog/Digital Circuits by Suppressing Variability and Low-Frequency Noise for FinFETs by Amorphous Metal Gate Technology |
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| 1st Author's Name | Takashi Matsukawa |
| 1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 2nd Author's Name | Koichi Fukuda |
| 2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 3rd Author's Name | Yongxun Liu |
| 3rd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 4th Author's Name | Junichi Tsukada |
| 4th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 5th Author's Name | Hiromi Yamauchi |
| 5th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 6th Author's Name | Yuki Ishikawa |
| 6th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 7th Author's Name | Kazuhiko Endo |
| 7th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 8th Author's Name | Shinichi O'uchi |
| 8th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 9th Author's Name | Shinji Migita |
| 9th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 10th Author's Name | Wataru Mizubayashi |
| 10th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 11th Author's Name | Yukinori Morita |
| 11th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 12th Author's Name | Hiroyuki Ota |
| 12th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 13th Author's Name | Meishoku Masahara |
| 13th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
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| 14th Author's Affiliation | () |
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| 15th Author's Affiliation | () |
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| Speaker | Author-1 |
| Date Time | 2015-01-27 16:20:00 |
| Presentation Time | 25 minutes |
| Registration for | SDM |
| Paper # | SDM2014-145 |
| Volume (vol) | vol.114 |
| Number (no) | no.421 |
| Page | pp.41-44 |
| #Pages | 4 |
| Date of Issue | 2015-01-20 (SDM) |
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