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Paper Abstract and Keywords
Presentation 2015-01-23 15:50
Study on detection method for clock error due to intentional electromagnetic interference
Atsushi Nagao, Yuichiro Okugawa, Kazuhiro Takaya (NTT), Yu-ichi Hayashi, Naofumi Homma, Takafumi Aoki (Tohoku Univ.) EMCJ2014-100
Abstract (in Japanese) (See Japanese page) 
(in English) Overclocking, which occurs because of the disruption of the clock frequency, causes LSI modules to malfunction. The Electromagnetic interference can also cause an LSI module to malfunction owing to overclocking. On the other hand, the clarification of malfunction factors is required to increase the immunity of LSI modules. With that, this paper proposes a method for detecting overclocking when electromagnetic interference is applied; the presence of overclocking is determined based on the output results from an evaluation circuit, which is installed in an LSI module. Further, experiments were conducted for a case in which glitches were introduced into the clock signal and another case where a continuous wave was applied, to examine the validity of the proposed method. As a result, we confirm that the evaluation circuit can correctly determine if overclocking is occurred or not. In addition, we confirm the outputs of the evaluation circuit that indicated the occurrence of overclocking when a continuous wave was injected. And, the change of the clock cycle was confirmed by fluctuation in voltage which is occurred by overlapping CW from observation of clock signal. Therefore, the evaluation circuit proposed in this paper was confirmed to be useful in detecting the overclocking.
Keyword (in Japanese) (See Japanese page) 
(in English) LSI module / Intentional electromagnetic interference / Overclocking / Glitch / Continuous wave / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 398, EMCJ2014-100, pp. 83-88, Jan. 2015.
Paper # EMCJ2014-100 
Date of Issue 2015-01-15 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ WPT  
Conference Date 2015-01-22 - 2015-01-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawaken Jichikaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Communication, Wireless Power Transmission, EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2015-01-EMCJ-WPT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on detection method for clock error due to intentional electromagnetic interference 
Sub Title (in English)  
Keyword(1) LSI module  
Keyword(2) Intentional electromagnetic interference  
Keyword(3) Overclocking  
Keyword(4) Glitch  
Keyword(5) Continuous wave  
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1st Author's Name Atsushi Nagao  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Yuichiro Okugawa  
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
3rd Author's Name Kazuhiro Takaya  
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
4th Author's Name Yu-ichi Hayashi  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Naofumi Homma  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
6th Author's Name Takafumi Aoki  
6th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2015-01-23 15:50:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2014-100 
Volume (vol) vol.114 
Number (no) no.398 
Page pp.83-88 
#Pages
Date of Issue 2015-01-15 (EMCJ) 


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