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| Paper Abstract and Keywords | ||
| Presentation | 2014-12-19 13:00 Study on reduction and control of NBTI-induced degradation in FPGA-based ring oscillators Yasuo Sato, Yousuke Miyake, Seiji Kajihara (Kyutech)  DC2014-67 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Ring oscillators are used for variety of applications to enhance reliability on LSIs or FPGAs; however, the performance degradation caused by physical aging phenomena such as NBTI is becoming a crucial issue. This paper proposes a design technology that reduces or controls the degradation of ring oscillators. The input values of look-up tables that constitute the oscillators are properly controlled during the off-state while the oscillator is not working. Further, the relation of the degradation amounts is discussed by comparing frequencies of plural oscillators. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | FPGA / NBTI / Degaradation / Ring Oscillator / LUT / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 114, no. 384, DC2014-67, pp. 1-6, Dec. 2014. | |
| Paper # | DC2014-67 | |
| Date of Issue | 2014-12-12 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2014-67 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2014-12-19 - 2014-12-19 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Safety, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2014-12-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on reduction and control of NBTI-induced degradation in FPGA-based ring oscillators |
| Sub Title (in English) | |
| Keyword(1) | FPGA |
| Keyword(2) | NBTI |
| Keyword(3) | Degaradation |
| Keyword(4) | Ring Oscillator |
| Keyword(5) | LUT |
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| Keyword(8) | |
| 1st Author's Name | Yasuo Sato |
| 1st Author's Affiliation | Kyushu Institute of Technology (Kyutech) |
| 2nd Author's Name | Yousuke Miyake |
| 2nd Author's Affiliation | Kyushu Institute of Technology (Kyutech) |
| 3rd Author's Name | Seiji Kajihara |
| 3rd Author's Affiliation | Kyushu Institute of Technology (Kyutech) |
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| Speaker | Author-1 |
| Date Time | 2014-12-19 13:00:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2014-67 |
| Volume (vol) | vol.114 |
| Number (no) | no.384 |
| Page | pp.1-6 |
| #Pages | 6 |
| Date of Issue | 2014-12-12 (DC) |
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