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| Presentation | 2014-12-01 15:15 [Poster Presentation] Reliability evaluation of Carbon Nanotube (CNT) based non-volatile memory Eisuke Yanagizawa (Chuo Univ.), Sheyang Ning (Chuo Univ./Tokyo Univ.), Ken Takeuchi (Chuo Univ.)  ICD2014-91 CPSY2014-103 Link to ES Tech. Rep. Archives: ICD2014-91 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Carbon nanotube (CNT) based non-volatile memory (NRAM) write and erase are implemented using Reset/Set program pulses. In detail, the Reset pulse increases cell resistance to high resistance state (HRS), whereas the Set pulse decreases cell resistance to low resistance state (LRS). In this way, the data 0 and data 1 can be stored for the non-volatile memory application. In this paper, NRAM program and read characteristics are investigated by using different program pulses and read voltages. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Carbon nanotube / non-volatile memory / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 114, no. 345, ICD2014-91, pp. 61-61, Dec. 2014. | |
| Paper # | ICD2014-91 | |
| Date of Issue | 2014-11-24 (ICD, CPSY) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2014-91 CPSY2014-103 Link to ES Tech. Rep. Archives: ICD2014-91 |
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| Conference Information | |
| Committee | ICD CPSY |
| Conference Date | 2014-12-01 - 2014-12-02 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2014-12-ICD-CPSY |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Reliability evaluation of Carbon Nanotube (CNT) based non-volatile memory |
| Sub Title (in English) | |
| Keyword(1) | Carbon nanotube |
| Keyword(2) | non-volatile memory |
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| 1st Author's Name | Eisuke Yanagizawa |
| 1st Author's Affiliation | Chuo University (Chuo Univ.) |
| 2nd Author's Name | Sheyang Ning |
| 2nd Author's Affiliation | Chuo University/Tokyo University (Chuo Univ./Tokyo Univ.) |
| 3rd Author's Name | Ken Takeuchi |
| 3rd Author's Affiliation | Chuo University (Chuo Univ.) |
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| Speaker | Author-1 |
| Date Time | 2014-12-01 15:15:00 |
| Presentation Time | 120 minutes |
| Registration for | ICD |
| Paper # | ICD2014-91, CPSY2014-103 |
| Volume (vol) | vol.114 |
| Number (no) | no.345(ICD), no.346(CPSY) |
| Page | p.61 |
| #Pages | 1 |
| Date of Issue | 2014-11-24 (ICD, CPSY) |
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