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| Presentation | 2014-11-30 15:15 Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)  EMD2014-92 Link to ES Tech. Rep. Archives: EMD2014-92 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation. They have developed a hammering oscillating mechanism (HOM) or a micro-sliding mechanism 1 (MSM1) which provides micro-oscillations for electrical contacts. It is shown that each mechanism is able to simulate an actual degradation phenomenon on electrical contacts. And they have also developed another mechanism, namely a micro-sliding mechanism 2 (MSM2) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges, which has more precise sliding performance, less thermal drift on sliding amplitude, and smaller sized system constituted of commercial parts. In this paper, they obtain the experimental results of minimal sliding amplitudes to make resistances fluctuate on electrical contacts under some conditions which are three types of input waveforms which are sinusoidal, rectangular, and impulsive, three levels of frictional force which are usual (1.6N/pin), middle (1.0N/pin), and smaller (0.3N/pin) between a male-pin and a female-part using the MSM2. In addition, they compare the differences on the minimal sliding amplitudes among the above conditions by means of dispersion analysis on statistical test on the degradation phenomenon of electrical contacts. Consequently they obtain that the larger the frictional force is the larger the minimal sliding amplitude is, and they also obtain that the amplitudes are larger in sinusoidal input than in rectangular one and are larger in rectangular input than in impulsive one. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electrical contact / micro-sliding mechanism / piezo-actuator / elastic hinge / frictional force / minimal sliding amplitude / statistical analysis / | |
| Reference Info. | IEICE Tech. Rep., vol. 114, no. 342, EMD2014-92, pp. 155-160, Nov. 2014. | |
| Paper # | EMD2014-92 | |
| Date of Issue | 2014-11-22 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2014-92 Link to ES Tech. Rep. Archives: EMD2014-92 |
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| Conference Information | |
| Committee | EMD |
| Conference Date | 2014-11-29 - 2014-11-30 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Chitose Cultural Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | International Session IS-EMD2014 |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2014-11-EMD |
| Language | English |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts by using a micro-sliding mechanism |
| Sub Title (in English) | The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3) |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-sliding mechanism |
| Keyword(3) | piezo-actuator |
| Keyword(4) | elastic hinge |
| Keyword(5) | frictional force |
| Keyword(6) | minimal sliding amplitude |
| Keyword(7) | statistical analysis |
| Keyword(8) | |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 2nd Author's Name | Keiji Koshida |
| 2nd Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 3rd Author's Name | Hiroaki Kubota |
| 3rd Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 4th Author's Name | Koichiro Sawa |
| 4th Author's Affiliation | Nippon Institute of Technology (Nippon Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2014-11-30 15:15:00 |
| Presentation Time | 20 minutes |
| Registration for | EMD |
| Paper # | EMD2014-92 |
| Volume (vol) | vol.114 |
| Number (no) | no.342 |
| Page | pp.155-160 |
| #Pages | 6 |
| Date of Issue | 2014-11-22 (EMD) |
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