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Paper Abstract and Keywords
Presentation 2014-11-28 16:00
An analytic evaluation on soft error immunity enhancement due to temporal triplication
Ryutaro Doi, Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2014-112 DC2014-66
Abstract (in Japanese) (See Japanese page) 
(in English) Chip-level soft error rate is increasing due to the device miniaturization and larger scale integration. Soft error is one of major factors that degrade the reliability of integrated circuits, and soft error aware design is demanded for applications that cannot allow any failures. As one of soft error countermeasures, spatial redundancy has been widely studied and adopted in real products because of the small speed overhead and the easiness of implementation. On the other hand, temporal redundancy, which is another well-known technique, is rarely adopted in practical applications and its usefulness is not quantitatively evaluated. This report analytically evaluates the soft error immunity enhancement thanks to temporal triplication. The evaluation result shows that the error rate reduction of the temporal triplication is comparable to that of the spatial triplication.
Keyword (in Japanese) (See Japanese page) 
(in English) Reliability / Soft Error / Temporal Triplication / Temporal Redundancy / Spatial Triplication / Spatial Redundancy / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 329, DC2014-66, pp. 263-268, Nov. 2014.
Paper # DC2014-66 
Date of Issue 2014-11-19 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2014-112 DC2014-66

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2014-11-26 - 2014-11-28 
Place (in Japanese) (See Japanese page) 
Place (in English) B-ConPlaza 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2014 -New Field of VLSI Design- 
Paper Information
Registration To DC 
Conference Code 2014-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An analytic evaluation on soft error immunity enhancement due to temporal triplication 
Sub Title (in English)  
Keyword(1) Reliability  
Keyword(2) Soft Error  
Keyword(3) Temporal Triplication  
Keyword(4) Temporal Redundancy  
Keyword(5) Spatial Triplication  
Keyword(6) Spatial Redundancy  
Keyword(7)  
Keyword(8)  
1st Author's Name Ryutaro Doi  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Masanori Hashimoto  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Takao Onoye  
3rd Author's Affiliation Osaka University (Osaka Univ.)
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Speaker
Date Time 2014-11-28 16:00:00 
Presentation Time 25 
Registration for DC 
Paper # IEICE-VLD2014-112,IEICE-DC2014-66 
Volume (vol) IEICE-114 
Number (no) no.328(VLD), no.329(DC) 
Page pp.263-268 
#Pages IEICE-6 
Date of Issue IEICE-VLD-2014-11-19,IEICE-DC-2014-11-19 


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