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Paper Abstract and Keywords
Presentation 2014-08-22 16:35
Degradation phenomenon of electrical contacts by a micro-sliding mechanism -- The comparison of the evaluated minimal sliding amplitudes under some conditions (2) --
Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55 Link to ES Tech. Rep. Archives: EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed a hammering oscillating mechanism which gives micro-oscillation to electrical
contacts, and have experimented. In addition, we have developed micro-sliding mechanisms for comparisons with
oscillation experiments. And we have discussed the in
uence of the micro-sliding or micro-oscillation on the resis-
tance of the connector pins. It is indicated that there are minimal sliding amplitudes or driving amplitudes within
21.5 hours by the sliding experiments. In this paper, we report statistical analyses for its minimal amplitudes.
Statistical analyses are carried out for the estimation of population mean values and analysis of variance.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / contact resistance / micro-sliding mechanism / statistics analysis / analysis of variance / point estimation / interval estimation /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 184, EMD2014-56, pp. 145-150, Aug. 2014.
Paper # EMD2014-56 
Date of Issue 2014-08-14 (R, EMD, CPM, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55 Link to ES Tech. Rep. Archives: EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55

Conference Information
Committee EMD LQE OPE CPM R  
Conference Date 2014-08-21 - 2014-08-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Otaru Economy Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2014-08-EMD-LQE-OPE-CPM-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by a micro-sliding mechanism 
Sub Title (in English) The comparison of the evaluated minimal sliding amplitudes under some conditions (2) 
Keyword(1) electrical contact  
Keyword(2) contact resistance  
Keyword(3) micro-sliding mechanism  
Keyword(4) statistics analysis  
Keyword(5) analysis of variance  
Keyword(6) point estimation  
Keyword(7) interval estimation  
Keyword(8)  
1st Author's Name Keiji Koshida  
1st Author's Affiliation TMC System Co. Ltd. (TMC System)
2nd Author's Name Shin-ichi Wada  
2nd Author's Affiliation TMC System Co. Ltd. (TMC System)
3rd Author's Name Hiroaki Kubota  
3rd Author's Affiliation TMC System Co. Ltd. (TMC System)
4th Author's Name Koichiro Sawa  
4th Author's Affiliation Nippon Institute of Technology (Nippon Inst. of Tech.)
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Speaker Author-2 
Date Time 2014-08-22 16:35:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # R2014-51, EMD2014-56, CPM2014-71, OPE2014-81, LQE2014-55 
Volume (vol) vol.114 
Number (no) no.183(R), no.184(EMD), no.185(CPM), no.186(OPE), no.187(LQE) 
Page pp.145-150 
#Pages
Date of Issue 2014-08-14 (R, EMD, CPM, OPE, LQE) 


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