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Paper Abstract and Keywords
Presentation 2014-08-22 16:15
Degradation Phenomenon of Electrical Contacts by a Micro-Sliding Mechanism -- The comparison of the evaluated minimal sliding amplitudes --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54 Link to ES Tech. Rep. Archives: EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed a mechanism which supplies reciprocal micro-sliding to electrical contacts directly driven by a piezo-electric actuator and four elastic hinges.
In this paper, it is indicated that there are the minimal sliding amplitudes under which there is rarely degradation phenomenon and over which there is mostly degradation phenomenon in the following conditions.
The conditions are two types of input waveform, three levels of frictional force between male-pins and female-parts, and the number of pins.
After statistical process, the evaluated values are changed slightly to another values. Moreover, each value of two-sided 95% confidence interval is calculated respectively.
It is indicated that statistically significant minimal sliding amplitudes are evaluated by the process.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-sliding mechanism / piezo-actuator / elastic hinge / frictional force / minimal sliding amplitude / statistical analysis /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 184, EMD2014-55, pp. 139-144, Aug. 2014.
Paper # EMD2014-55 
Date of Issue 2014-08-14 (R, EMD, CPM, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54 Link to ES Tech. Rep. Archives: EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54

Conference Information
Committee EMD LQE OPE CPM R  
Conference Date 2014-08-21 - 2014-08-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Otaru Economy Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2014-08-EMD-LQE-OPE-CPM-R 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts by a Micro-Sliding Mechanism 
Sub Title (in English) The comparison of the evaluated minimal sliding amplitudes 
Keyword(1) electrical contact  
Keyword(2) micro-sliding mechanism  
Keyword(3) piezo-actuator  
Keyword(4) elastic hinge  
Keyword(5) frictional force  
Keyword(6) minimal sliding amplitude  
Keyword(7) statistical analysis  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC System)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC System)
3rd Author's Name Hiroaki Kubota  
3rd Author's Affiliation TMC System Co. Ltd. (TMC System)
4th Author's Name Koichiro Sawa  
4th Author's Affiliation Nippon Institute of Technology (Nippon Inst. of Tech.)
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Speaker Author-1 
Date Time 2014-08-22 16:15:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # R2014-50, EMD2014-55, CPM2014-70, OPE2014-80, LQE2014-54 
Volume (vol) vol.114 
Number (no) no.183(R), no.184(EMD), no.185(CPM), no.186(OPE), no.187(LQE) 
Page pp.139-144 
#Pages
Date of Issue 2014-08-14 (R, EMD, CPM, OPE, LQE) 


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