IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
... (for ESS/CS/ES/ISS)
Tech. Rep. Archives
... (for ES/CS)
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-08-05 10:50
40nm ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU
Yoshisato Yokoyama, Yuichiro Ishii, Hidemitsu Kojima, Atsushi Miyanishi, Yoshiki Tsujihashi, Shinobu Asayama, Kazutoshi Shiba, Koji Tanaka, Tatsuya Fukuda, Koji Nii, Kazumasa Yanagisawa (Renesas) Link to ES Tech. Rep. Archives: SDM2014-74 ICD2014-43
Abstract (in Japanese) (See Japanese page) 
(in English) (Available after conference date)
Keyword (in Japanese) (See Japanese page) 
(in English) SRAM / standby / leak / MCU / 40nm / 170°C / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 175, ICD2014-43, pp. 65-70, Aug. 2014.
Paper # ICD2014-43 
Date of Issue 2014-07-28 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Conference Information
Committee ICD SDM  
Conference Date 2014-08-04 - 2014-08-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ., Multimedia Education Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2014-08-ICD-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) 40nm ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU 
Sub Title (in English)  
Keyword(1) SRAM  
Keyword(2) standby  
Keyword(3) leak  
Keyword(4) MCU  
Keyword(5) 40nm  
Keyword(6) 170°C  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoshisato Yokoyama  
1st Author's Affiliation Renesas Electronics (Renesas)
2nd Author's Name Yuichiro Ishii  
2nd Author's Affiliation Renesas Electronics (Renesas)
3rd Author's Name Hidemitsu Kojima  
3rd Author's Affiliation Renesas Electronics (Renesas)
4th Author's Name Atsushi Miyanishi  
4th Author's Affiliation Renesas Electronics (Renesas)
5th Author's Name Yoshiki Tsujihashi  
5th Author's Affiliation Renesas Electronics (Renesas)
6th Author's Name Shinobu Asayama  
6th Author's Affiliation Renesas Electronics (Renesas)
7th Author's Name Kazutoshi Shiba  
7th Author's Affiliation Renesas Electronics (Renesas)
8th Author's Name Koji Tanaka  
8th Author's Affiliation Renesas Electronics (Renesas)
9th Author's Name Tatsuya Fukuda  
9th Author's Affiliation Renesas Electronics (Renesas)
10th Author's Name Koji Nii  
10th Author's Affiliation Renesas Electronics (Renesas)
11th Author's Name Kazumasa Yanagisawa  
11th Author's Affiliation Renesas Electronics (Renesas)
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2014-08-05 10:50:00 
Presentation Time 25 
Registration for ICD 
Paper # IEICE-SDM2014-74,IEICE-ICD2014-43 
Volume (vol) IEICE-114 
Number (no) no.174(SDM), no.175(ICD) 
Page pp.65-70 
#Pages IEICE-6 
Date of Issue IEICE-SDM-2014-07-28,IEICE-ICD-2014-07-28 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan