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Paper Abstract and Keywords
Presentation 2014-08-04 14:55
[Invited Talk] A 90-nm Three-terminal MRAM Embedded Nonvolatile Microcontroller for Standby-Power-Critical Applications
Noboru Sakimura, Yukihide Tsuji, Ryusuke Nebashi, Hiroaki Honjo, Ayuka Morioka, Kunihiko Ishihara (NEC), Keizo Kinoshita, Shunsuke Fukami (Tohoku Univ.), Sadahiko Miura (NEC), Naoki Kasai, Tetsuo Endoh, Hideo Ohno, Takahiro Hanyu (Tohoku Univ.), Tadahiko Sugibayashi (NEC) Link to ES Tech. Rep. Archives: SDM2014-69 ICD2014-38
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 175, ICD2014-38, pp. 39-44, Aug. 2014.
Paper # ICD2014-38 
Date of Issue 2014-07-28 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Conference Information
Committee ICD SDM  
Conference Date 2014-08-04 - 2014-08-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ., Multimedia Education Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2014-08-ICD-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A 90-nm Three-terminal MRAM Embedded Nonvolatile Microcontroller for Standby-Power-Critical Applications 
Sub Title (in English)  
1st Author's Name Noboru Sakimura  
1st Author's Affiliation NEC Corporation (NEC)
2nd Author's Name Yukihide Tsuji  
2nd Author's Affiliation NEC Corporation (NEC)
3rd Author's Name Ryusuke Nebashi  
3rd Author's Affiliation NEC Corporation (NEC)
4th Author's Name Hiroaki Honjo  
4th Author's Affiliation NEC Corporation (NEC)
5th Author's Name Ayuka Morioka  
5th Author's Affiliation NEC Corporation (NEC)
6th Author's Name Kunihiko Ishihara  
6th Author's Affiliation NEC Corporation (NEC)
7th Author's Name Keizo Kinoshita  
7th Author's Affiliation Tohoku University (Tohoku Univ.)
8th Author's Name Shunsuke Fukami  
8th Author's Affiliation Tohoku University (Tohoku Univ.)
9th Author's Name Sadahiko Miura  
9th Author's Affiliation NEC Corporation (NEC)
10th Author's Name Naoki Kasai  
10th Author's Affiliation Tohoku University (Tohoku Univ.)
11th Author's Name Tetsuo Endoh  
11th Author's Affiliation Tohoku University (Tohoku Univ.)
12th Author's Name Hideo Ohno  
12th Author's Affiliation Tohoku University (Tohoku Univ.)
13th Author's Name Takahiro Hanyu  
13th Author's Affiliation Tohoku University (Tohoku Univ.)
14th Author's Name Tadahiko Sugibayashi  
14th Author's Affiliation NEC Corporation (NEC)
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17th Author's Affiliation ()
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Date Time 2014-08-04 14:55:00 
Presentation Time 50 
Registration for ICD 
Paper # IEICE-SDM2014-69,IEICE-ICD2014-38 
Volume (vol) IEICE-114 
Number (no) no.174(SDM), no.175(ICD) 
Page pp.39-44 
#Pages IEICE-6 
Date of Issue IEICE-SDM-2014-07-28,IEICE-ICD-2014-07-28 

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