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Paper Abstract and Keywords
Presentation 2014-07-04 15:40
[Memorial Lecture] Measurement System of Electric Fields by using Optically Modulated Scatterer
Takahiro Kurosawa (Akita Industrial)
Abstract (in Japanese) (See Japanese page) 
(in English) Electric field measurement system based on the modulated scattering technique with optically modulated scatterer has developed. A semiconductor is used as the scatterer, and illumination of the semiconductor with photons of energy larger than the band-gap energy of the scatterer, the scattering cross section can modulate. The modulated scattering signal is received by a receiving antenna, and demodulated, the scattered wave intensity can be obtained. The electric field at the scatterer is estimated from the intensity of the scattered wave. Sensitivity of the system was 65 dBμV/m at 1.05 GHz. The sensitivity was increased with increasing the frequency. With near-field measurement of the microstrip line, the system can detect the power of -40 dBm. The obtained spatial resolution depends on the diameter of the illuminated light, and the distribution in the microstrip line (width: 3 mm) could be measured.
Keyword (in Japanese) (See Japanese page) 
(in English) Electric Field Measurement / Modulated Scattering / Dielectric Scatterer / Semiconductor / EMC / / /  
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Conference Information
Committee PEM  
Conference Date 2014-07-04 - 2014-07-04 
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Paper Information
Registration To PEM 
Conference Code 2014-07-PEM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement System of Electric Fields by using Optically Modulated Scatterer 
Sub Title (in English)  
Keyword(1) Electric Field Measurement  
Keyword(2) Modulated Scattering  
Keyword(3) Dielectric Scatterer  
Keyword(4) Semiconductor  
Keyword(5) EMC  
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1st Author's Name Takahiro Kurosawa  
1st Author's Affiliation Akita Industrial Technology Center (Akita Industrial)
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Speaker Author-1 
Date Time 2014-07-04 15:40:00 
Presentation Time 50 minutes 
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