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Paper Abstract and Keywords
Presentation 2014-06-27 13:15
Pattern Measurements of Base Station Antennas by Near-Field Measurements on a Circle(1) -- Comparison Among Kim Method, Near-Field Method, and Far-Field Method --
Masanobu Hirose (AIST), Masayuki Nakano (KDDI Lab.), Michitaka Ameya, Satoru Kurokawa (AIST)
Abstract (in Japanese) (See Japanese page) 
(in English) Kim method realizes to obtain the sharp-beam far-field pattern of a base station antenna from the measurement on a circle whose radius is tenth shorter than the well-known far-field criteria. Simulation reveals the application range of the Kim method for the base station antenna. Measurements by Kim method are compared with the measurements by a cylindrical near-field scanning method and far-field method, and the calculation by MoM. As the results, we found that Kim method and other methods agree well with each other in the important parameters for the base station antenna such as 3 dB beamwidth, the levels and the angles of the first sidelobe and the first null.
Keyword (in Japanese) (See Japanese page) 
(in English) Kim method / Measurement on a circle / Ultra-short distance measurements / Base station antenna / / / /  
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Conference Information
Committee AP  
Conference Date 2014-06-27 - 2014-06-27 
Place (in Japanese) (See Japanese page) 
Place (in English) AIST 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Measurement Technique of Radio Equipment and Antenna Systems 
Paper Information
Registration To AP 
Conference Code 2014-06-AP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Pattern Measurements of Base Station Antennas by Near-Field Measurements on a Circle(1) 
Sub Title (in English) Comparison Among Kim Method, Near-Field Method, and Far-Field Method 
Keyword(1) Kim method  
Keyword(2) Measurement on a circle  
Keyword(3) Ultra-short distance measurements  
Keyword(4) Base station antenna  
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1st Author's Name Masanobu Hirose  
1st Author's Affiliation National Institue of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Masayuki Nakano  
2nd Author's Affiliation KDDI Laboratory (KDDI Lab.)
3rd Author's Name Michitaka Ameya  
3rd Author's Affiliation National Institue of Advanced Industrial Science and Technology (AIST)
4th Author's Name Satoru Kurokawa  
4th Author's Affiliation National Institue of Advanced Industrial Science and Technology (AIST)
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Speaker Author-1 
Date Time 2014-06-27 13:15:00 
Presentation Time 25 minutes 
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