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Paper Abstract and Keywords
Presentation 2014-04-18 13:55
Development of High Sensitivity On-chip Active Magnetic Field Probe for IC-chip level RF EM Noise Measurement
Yojiro Shigeta, Noriyuki Sato, Kaoru Arai, Masahiro Yamaguchi (Tohoku Univ.), Singo Kageyama (TDC) EMCJ2014-3
Abstract (in Japanese) (See Japanese page) 
(in English) An on-chip active magnetic field probe having high sensitivity and high spatial resolution simultaneously has been designed and fabricated. Taking into account the high sensitivity in the 2.1 GHz bands used for the LTE(Long Term Evolution)-class receiver circuit, a set of loop coil and differential amplifier were designed and implemented in 0.18 µm Si-CMOS technology and mounted to PCB.
Usefulness of this active probe for near-field measurements for LTE-class RFIC chips has been demonstrated.
Keyword (in Japanese) (See Japanese page) 
(in English) magnetic near field measurement / magnetic field probe / electromagnetic compatibility / LTE-class receiver / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 15, EMCJ2014-3, pp. 13-18, April 2014.
Paper # EMCJ2014-3 
Date of Issue 2014-04-11 (EMCJ) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2014-04-18 - 2014-04-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Univ. Toyama 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Antenna Propagation, EMC 
Paper Information
Registration To EMCJ 
Conference Code 2014-04-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Development of High Sensitivity On-chip Active Magnetic Field Probe for IC-chip level RF EM Noise Measurement 
Sub Title (in English)  
Keyword(1) magnetic near field measurement  
Keyword(2) magnetic field probe  
Keyword(3) electromagnetic compatibility  
Keyword(4) LTE-class receiver  
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1st Author's Name Yojiro Shigeta  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Noriyuki Sato  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Kaoru Arai  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Masahiro Yamaguchi  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Singo Kageyama  
5th Author's Affiliation Toppan Technical Design Center Company Limited (TDC)
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Speaker
Date Time 2014-04-18 13:55:00 
Presentation Time 25 
Registration for EMCJ 
Paper # IEICE-EMCJ2014-3 
Volume (vol) IEICE-114 
Number (no) no.15 
Page pp.13-18 
#Pages IEICE-6 
Date of Issue IEICE-EMCJ-2014-04-11 


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