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| Presentation | 2014-03-05 10:50 Analysis of Radiation-Induced Errors in PLL based on Behavioral Modeling SinNyoung Kim (Kyoto Univ.), Tomohiro Fujita (Ritsumeikan Univ.), Akira Tsuchiya, Hidetoshi Onodera (Kyoto Univ.)  VLD2013-158 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | This paper presents an analysis of radiation-induced errors in PLL based on behavioral modeling. Radiation strike leads to errors in PLLs. Effects of the radiation-induced errors are different for times and locations of radiation strikes. Conventional works examine all possibility to evaluate radiation effect on PLLs. To avoid such a brute-force analysis, a behavioral model of radiation-induced errors is developed. The behavioral model facilitates analysis of radiation effect on the whole PLL. As a result of the analysis, numerical data of radiation effect on the PLL are provided for locations and times of a radiation strike. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | PLL / Soft error / Behavioral model / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 454, VLD2013-158, pp. 131-136, March 2014. | |
| Paper # | VLD2013-158 | |
| Date of Issue | 2014-02-24 (VLD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2013-158 |
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| Conference Information | |
| Committee | VLD |
| Conference Date | 2014-03-03 - 2014-03-05 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Okinawa Seinen Kaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Technology for System-on-Silicon |
| Paper Information | |
| Registration To | VLD |
| Conference Code | 2014-03-VLD |
| Language | English |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis of Radiation-Induced Errors in PLL based on Behavioral Modeling |
| Sub Title (in English) | |
| Keyword(1) | PLL |
| Keyword(2) | Soft error |
| Keyword(3) | Behavioral model |
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| 1st Author's Name | SinNyoung Kim |
| 1st Author's Affiliation | Kyoto University (Kyoto Univ.) |
| 2nd Author's Name | Tomohiro Fujita |
| 2nd Author's Affiliation | Ritsumeikan University (Ritsumeikan Univ.) |
| 3rd Author's Name | Akira Tsuchiya |
| 3rd Author's Affiliation | Kyoto University (Kyoto Univ.) |
| 4th Author's Name | Hidetoshi Onodera |
| 4th Author's Affiliation | Kyoto University (Kyoto Univ.) |
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| Speaker | Author-1 |
| Date Time | 2014-03-05 10:50:00 |
| Presentation Time | 25 minutes |
| Registration for | VLD |
| Paper # | VLD2013-158 |
| Volume (vol) | vol.113 |
| Number (no) | no.454 |
| Page | pp.131-136 |
| #Pages | 6 |
| Date of Issue | 2014-02-24 (VLD) |
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