IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-02-28 10:50
Tuning of Resistance of Au Nanowires by Feedback-Controlled Electromigration Using Real-Time Operating System (RTOS)
Masazumi Ando, Yuma Kanamaru, Takanari Saito, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.) ED2013-146 SDM2013-161 Link to ES Tech. Rep. Archives: ED2013-146 SDM2013-161
Abstract (in Japanese) (See Japanese page) 
(in English) Electromigration method becomes promising for the fabrication of nanogap electrodes. However, the nanogap electrodes fabricated by this method tend to exhibit high tunnel resistance. A feedback-controlled electromigration (FCE) scheme has been successfully and widely employed to make nanogaps with controlled electrical properties. We have already reported that the control of the channel resistance of metal nanowires is performed by stepwise-feedback controlled electromigration (SFCE) using general-purpose operating system (GPOS). SFCE procedure finely and stepwisely divides a conventional FCE scheme into several FCE cycles. Here, we propose SFCE method using real-time operating system (RTOS) in order to precisely and stably tune the channel resistance of metal nanowire at room temperature. GPOS is usually designed to maintain user responsiveness with many programs and services running, while RTOS is designed to run critical applications reliably and with precise timing. In this report, it is revealed that control characteristics of the channel resistance of metal nanowire are successfully improved using RTOS-controlled SFCE method, as compared with SFCE using GPOS. These results indicate that RTOS is useful for the stable control of the channel resistance of metal nanowire using SFCE scheme.
Keyword (in Japanese) (See Japanese page) 
(in English) real-time operating system / electromigration / nanogap / feedback-controlled electromigration / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 449, ED2013-146, pp. 77-82, Feb. 2014.
Paper # ED2013-146 
Date of Issue 2014-02-20 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2013-146 SDM2013-161 Link to ES Tech. Rep. Archives: ED2013-146 SDM2013-161

Conference Information
Committee ED SDM  
Conference Date 2014-02-27 - 2014-02-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. Centennial Hall 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Functional nanodevices and related technologies 
Paper Information
Registration To ED 
Conference Code 2014-02-ED-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Tuning of Resistance of Au Nanowires by Feedback-Controlled Electromigration Using Real-Time Operating System (RTOS) 
Sub Title (in English)  
Keyword(1) real-time operating system  
Keyword(2) electromigration  
Keyword(3) nanogap  
Keyword(4) feedback-controlled electromigration  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Masazumi Ando  
1st Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agr. & Tech.)
2nd Author's Name Yuma Kanamaru  
2nd Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agr. & Tech.)
3rd Author's Name Takanari Saito  
3rd Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agr. & Tech.)
4th Author's Name Jun-ichi Shirakashi  
4th Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agr. & Tech.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2014-02-28 10:50:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2013-146, SDM2013-161 
Volume (vol) vol.113 
Number (no) no.449(ED), no.450(SDM) 
Page pp.77-82 
#Pages
Date of Issue 2014-02-20 (ED, SDM) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan