Paper Abstract and Keywords |
Presentation |
2014-01-31 10:45
Improving a Test Case Generation Method for Faulty Interaction Location Takahiro Nagamoto, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ) MSS2013-64 SS2013-61 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper discusses the location of interaction faults in software interaction testing.In our previous
study we proposed an approach to generate a test suite that can be used to identify a faulty interaction.This
approach works as follows.First, a test set is generated using an existing method for pair-wise testing.Second,
pair-wise interactions that cannot be located by the test set are enumerated.Finally, test cases are repeatedly
added to the test set until all pair-wise interactions can be located.In our previous study, we implemented an
algorithm that follows this approach and showed that it is possible to locate a faulty interaction by using a test
set that is approximately three times larger than that of pair-wise testing.In this work, we improve the algorithm
by modifying the second step, where test cases are selected so that interactions that could not be identied can
be located.The results of applying the new algorithm to some problem instances show that the modication can
reduce the number of test cases, which is nearly two and a half times of that of pair-wise testing. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
pair-wise testing / interaction faults / locating array / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 113, no. 422, SS2013-61, pp. 77-81, Jan. 2014. |
Paper # |
SS2013-61 |
Date of Issue |
2014-01-23 (MSS, SS) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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MSS2013-64 SS2013-61 |
Conference Information |
Committee |
SS MSS |
Conference Date |
2014-01-30 - 2014-01-31 |
Place (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
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Paper Information |
Registration To |
SS |
Conference Code |
2014-01-SS-MSS |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Improving a Test Case Generation Method for Faulty Interaction Location |
Sub Title (in English) |
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Keyword(1) |
pair-wise testing |
Keyword(2) |
interaction faults |
Keyword(3) |
locating array |
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1st Author's Name |
Takahiro Nagamoto |
1st Author's Affiliation |
Osaka University (Osaka Univ) |
2nd Author's Name |
Hideharu Kojima |
2nd Author's Affiliation |
Osaka University (Osaka Univ) |
3rd Author's Name |
Tatsuhiro Tsuchiya |
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Osaka University (Osaka Univ) |
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Speaker |
Author-1 |
Date Time |
2014-01-31 10:45:00 |
Presentation Time |
25 minutes |
Registration for |
SS |
Paper # |
MSS2013-64, SS2013-61 |
Volume (vol) |
vol.113 |
Number (no) |
no.421(MSS), no.422(SS) |
Page |
pp.77-81 |
#Pages |
5 |
Date of Issue |
2014-01-23 (MSS, SS) |
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