Paper Abstract and Keywords |
Presentation |
2014-01-29 14:50
Prediction Model for Process Variation and BTI-Induced Degradation by Measurement Data on FPGA Michitarou Yabuuchi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2013-129 CPSY2013-100 RECONF2013-83 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We propose a prediction model for BTI-induced degradation by
measurement data on 65nm-process FPGAs. BTI-induced degradation is
becoming an important reliability problem on highly scaled FPGAs.
The degradation prediction is indispensable. But it is hard to predict the
amount of degradations because the aging process is fluctuated by
random device characteristics. We measure and analyze process variations
and the aging degradation by ring oscillators on 60nm FPGAs.
In this paper, the prediction model for process variations and BTI is
proposed and the frequency of the worst case ring oscillator is
decreasing 4% for 10years. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
FPGA / degradation prediction / reliability / process variation / BTI / / / |
Reference Info. |
IEICE Tech. Rep., vol. 113, no. 416, VLD2013-129, pp. 161-166, Jan. 2014. |
Paper # |
VLD2013-129 |
Date of Issue |
2014-01-21 (VLD, CPSY, RECONF) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2013-129 CPSY2013-100 RECONF2013-83 |
Conference Information |
Committee |
IPSJ-SLDM CPSY RECONF VLD |
Conference Date |
2014-01-28 - 2014-01-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hiyoshi Campus, Keio University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
FPGA Applications, etc |
Paper Information |
Registration To |
VLD |
Conference Code |
2014-01-SLDM-CPSY-RECONF-VLD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Prediction Model for Process Variation and BTI-Induced Degradation by Measurement Data on FPGA |
Sub Title (in English) |
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Keyword(1) |
FPGA |
Keyword(2) |
degradation prediction |
Keyword(3) |
reliability |
Keyword(4) |
process variation |
Keyword(5) |
BTI |
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1st Author's Name |
Michitarou Yabuuchi |
1st Author's Affiliation |
Kyoto Institute of Technology (Kyoto Inst. of Tech.) |
2nd Author's Name |
Kazutoshi Kobayashi |
2nd Author's Affiliation |
Kyoto Institute of Technology (Kyoto Inst. of Tech.) |
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Speaker |
Author-1 |
Date Time |
2014-01-29 14:50:00 |
Presentation Time |
25 minutes |
Registration for |
VLD |
Paper # |
VLD2013-129, CPSY2013-100, RECONF2013-83 |
Volume (vol) |
vol.113 |
Number (no) |
no.416(VLD), no.417(CPSY), no.418(RECONF) |
Page |
pp.161-166 |
#Pages |
6 |
Date of Issue |
2014-01-21 (VLD, CPSY, RECONF) |
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