Paper Abstract and Keywords |
Presentation |
2014-01-29 10:25
[Invited Talk]
High Electron Mobility Triangular InGaAs-OI nMOSFETs with (111)B Side Surfaces Formed by MOVPE Regrowth Toshifumi Irisawa, Minoru Oda, Keiji Ikeda, Yoshihiko Moriyama, Eiko Mieda, Wipakorn. Jevasuwan, Tatsuro Maeda (AIST), Osamu Ichikawa, Takenori Osada, Masahiko Hata (Sumitomo Chemical), Yasuyuki Miyamoto (Tokyo Inst. of Tech.), Tsutomu Tezuka (AIST) SDM2013-137 Link to ES Tech. Rep. Archives: SDM2013-137 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
riangular In0.53Ga0.47As-OI nMOSFETs with smooth (111)B side surfaces on Si have been successfully fabricated. The triangular shaped channels with bottom width down to 30 nm were formed by MOVPE growth on narrow InGaAs-OI fins. The formed (111)B surface provided higher mobility compared with reference InGaAs-OI tri-gate (1.9x) as well as bulk (100) InGaAs nMOSFETs (1.6x), which is possibly due to reduced Dit in conduction band and resultant suppressed carrier trapping at the MOS interface. Lower noise and hysteresis in triangular device supported this model. High Ion value of 930 A/m at Lch = 300 nm indicates the potential of the triangular InGaAs-OI nMOSFETs for ultra-low power and high performance CMOS applications. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
InGaAs-OI / MOSFET / High mobility / Triangular channel / Multi-gate / (111)B surface / / |
Reference Info. |
IEICE Tech. Rep., vol. 113, no. 420, SDM2013-137, pp. 9-12, Jan. 2014. |
Paper # |
SDM2013-137 |
Date of Issue |
2014-01-22 (SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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SDM2013-137 Link to ES Tech. Rep. Archives: SDM2013-137 |
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