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| Presentation | 2014-01-28 15:00 [Poster Presentation] An Optimum Asymmetric Coding in Each Number of PE Cycle for 1Xnm NAND Flash Memories Senju Yamazaki (Chuo Univ), Shuhei Tanakamaru (Univ of Tokyo), Ken Takeuchi (Chuo Univ)  ICD2013-106 Link to ES Tech. Rep. Archives: ICD2013-106 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The asymmetric coding increases the population of ‘1’s or ‘0’s in programming data to reduce bit errors, and thus reliability of NAND flash memories improves. Furthermore this method can change the rate of ‘1’s or ‘0’s in programming data by changing the code length. This paper verifies the effect of asymmetric coding of 1Xnm NAND flash memories in each number of PE cycle and each code length. Furthermore the optimum asymmetric coding is investigated. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | NAND flash memory / asymmetric coding / reliability / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 419, ICD2013-106, pp. 19-19, Jan. 2014. | |
| Paper # | ICD2013-106 | |
| Date of Issue | 2014-01-21 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2013-106 Link to ES Tech. Rep. Archives: ICD2013-106 |
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| Conference Information | |
| Committee | ICD |
| Conference Date | 2014-01-28 - 2014-01-29 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyoto Univ. Tokeidai Kinenkan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2014-01-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Optimum Asymmetric Coding in Each Number of PE Cycle for 1Xnm NAND Flash Memories |
| Sub Title (in English) | |
| Keyword(1) | NAND flash memory |
| Keyword(2) | asymmetric coding |
| Keyword(3) | reliability |
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| 1st Author's Name | Senju Yamazaki |
| 1st Author's Affiliation | Chuo University (Chuo Univ) |
| 2nd Author's Name | Shuhei Tanakamaru |
| 2nd Author's Affiliation | University of Tokyo (Univ of Tokyo) |
| 3rd Author's Name | Ken Takeuchi |
| 3rd Author's Affiliation | Chuo University (Chuo Univ) |
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| Speaker | Author-1 |
| Date Time | 2014-01-28 15:00:00 |
| Presentation Time | 120 minutes |
| Registration for | ICD |
| Paper # | ICD2013-106 |
| Volume (vol) | vol.113 |
| Number (no) | no.419 |
| Page | p.19 |
| #Pages | 1 |
| Date of Issue | 2014-01-21 (ICD) |
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